3DXRD (original) (raw)
3D X-ray diffraction (3DXRD) is a microscopy technique using hard X-rays (with energy in the 30-100 keV range) to investigate the internal structure of polycrystalline materials in three dimensions. For a given sample, 3DXRD returns the shape, juxtaposition, and orientation of the crystallites ("grains") it is made of. 3DXRD allows investigating micrometer- to millimetre-sized samples with resolution ranging from hundreds of nanometers to micrometers. Other techniques employing X-rays to investigate the internal structure of polycrystalline materials include X-ray diffraction contrast tomography (DCT) and high energy X-ray diffraction (HEDM).
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| dbo:abstract | 3D X-ray diffraction (3DXRD) is a microscopy technique using hard X-rays (with energy in the 30-100 keV range) to investigate the internal structure of polycrystalline materials in three dimensions. For a given sample, 3DXRD returns the shape, juxtaposition, and orientation of the crystallites ("grains") it is made of. 3DXRD allows investigating micrometer- to millimetre-sized samples with resolution ranging from hundreds of nanometers to micrometers. Other techniques employing X-rays to investigate the internal structure of polycrystalline materials include X-ray diffraction contrast tomography (DCT) and high energy X-ray diffraction (HEDM). Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: * They require less sample preparation, thus limiting the introduction of new structures in the sample. * They can be used to investigate larger samples and to employ more complicated sample environments. * They enable to study how 3D grain structures evolve with time. * Since measurements do not alter the sample, different types of analysis can be made in sequence. (en) |
| dbo:wikiPageID | 53764217 (xsd:integer) |
| dbo:wikiPageLength | 11201 (xsd:nonNegativeInteger) |
| dbo:wikiPageRevisionID | 1083558842 (xsd:integer) |
| dbo:wikiPageWikiLink | dbr:Algebraic_reconstruction_technique dbr:Electrons dbr:Monte_Carlo_method dbc:Microscopy dbc:X-ray_instrumentation dbr:European_Synchrotron_Radiation_Facility dbr:Diffraction dbr:X-rays dbr:Neutrons dbr:Diffraction_Tomography dbr:Synchrotron dbr:Bragg_condition dbr:Crystallites |
| dbp:wikiPageUsesTemplate | dbt:Reflist |
| dcterms:subject | dbc:Microscopy dbc:X-ray_instrumentation |
| rdfs:comment | 3D X-ray diffraction (3DXRD) is a microscopy technique using hard X-rays (with energy in the 30-100 keV range) to investigate the internal structure of polycrystalline materials in three dimensions. For a given sample, 3DXRD returns the shape, juxtaposition, and orientation of the crystallites ("grains") it is made of. 3DXRD allows investigating micrometer- to millimetre-sized samples with resolution ranging from hundreds of nanometers to micrometers. Other techniques employing X-rays to investigate the internal structure of polycrystalline materials include X-ray diffraction contrast tomography (DCT) and high energy X-ray diffraction (HEDM). (en) |
| rdfs:label | 3DXRD (en) |
| owl:sameAs | wikidata:3DXRD https://global.dbpedia.org/id/2qxvT |
| prov:wasDerivedFrom | wikipedia-en:3DXRD?oldid=1083558842&ns=0 |
| foaf:isPrimaryTopicOf | wikipedia-en:3DXRD |
| is dbo:wikiPageWikiLink of | dbr:Discrete_tomography |
| is foaf:primaryTopic of | wikipedia-en:3DXRD |