MIL-STD-883 (original) (raw)
The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are fo
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| dbo:abstract | The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The standard was issued by Department of Defense, US. (en) |
| dbo:wikiPageExternalLink | https://landandmaritimeapps.dla.mil/Downloads/MilSpec/Docs/MIL-STD-883/std883.pdf https://web.archive.org/web/20130220235800/http:/www.landandmaritime.dla.mil/Programs/MilSpec/ListDocs.aspx%3FBasicDoc=MIL-PRF-19500 https://web.archive.org/web/20130304083138/http:/www.landandmaritime.dla.mil/Programs/MilSpec/listdocs.aspx%3FBasicDoc=MIL-PRF-38534 https://web.archive.org/web/20130313074351/http:/www.landandmaritime.dla.mil/Programs/MilSpec/ListDocs.aspx%3FBasicDoc=MIL-STD-1835 https://web.archive.org/web/20130523221124/http:/www.landandmaritime.dla.mil/Programs/MilSpec/ListDocs.aspx%3FBasicDoc=MIL-PRF-38535 |
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| rdfs:comment | The MIL-STD-883 standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within military and aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are fo (en) |
| rdfs:label | MIL-STD-883 (en) |
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