Proceedings (original) (raw)

Research on cracking WIFI wireless network using Kali-Linux penetration testing software

Lin Wang, Chin Ta Chen, Chih Ming Tsai (2023)

EUV optics: status, outlook and future

Paul Graeupner, Peter Kuerz, Thomas Stammler, Jan van Schoot, Judon Stoeldraijer (2022)

Enhancing SVT-AV1 with LCEVC to improve quality-cycles trade-offs and enhance sustainability of VOD transcoding

Guendalina Cobianchi et al. (2022)

Metal oxide resist (MOR) EUV lithography processes for DRAM application

Shinichiro Kawakami et al. (2022)

Memory technology: process and cell architecture

Jeongdong Choe (2023)

Overview of stitching for high NA: Imaging and overlay experimental and simulation results

Natalia Davydova et al. (2023)

Hyper-NA EUV lithography: An imaging perspective

Inhwan Lee, Joern-Holger Franke, Vicky Philipsen, Kurt Ronse, Stefan De Gendt, Eric Hendrickx (2023)

Quantum imaging overview

Miles Padgett (2023)

Soft x-ray: novel metrology for 3D profilometry and device pitch overlay

Christina Porter et al. (2023)

Direct print EUV patterning of tight pitch metal layers for Intel 18A process technology node

R. Venkatesan et al. (2022)