Digital Surf - Surface Imaging, Analysis and Metrology Software (original) (raw)
MountainsLab® for multi-instrument compatibility
Ultimate surface analysis suite and point of confluence for data from any kind of instrument, the ideal solution for labs working with multiple types of microscopes
MountainsMap® for Profilometry
Surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers
MountainsSEM® for Scanning Electron Microscopy
Visualization and analysis software for scanning electron microscopes (SEM) with tools for 3D reconstruction, colorization, particle analysis & volume electron microscopy (FIB-SEM, serial block-face SEM, array tomography etc.)
MountainsSPIP® for Scanning Probe Microscopy
Analysis software for scanning probe microscopy techniques including atomic force microscopy (AFM) and STM, MFM, SNOM, CSAFM, KPFM, etc.
MountainsSpectral® for Spectroscopy
Data processing and correlative analysis software for spectroscopic techniques (Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF etc.)
MountainsImage® for Light Microscopy
Image visualization & analysis software for light microscopes and other imaging systems producing B&W or color images without topography
Digital Surf has been developing surface imaging & metrology software for profilers and microscopes since 1989
Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 22,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.
Application areas include: automotive, materials science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters
Blog
The benefits of material ratio-based parameters
April 17, 2025
François Blateyron, Digital Surf’s senior surface metrology expert, explains the benefits of material ratio-based parameters and why users should move beyond Ra or Sa for evaluating the functional behavior of mechanical components.