3D X-ray Microscopes (original) (raw)
XRM
3D XRM for Material Science
Bruker’s portfolio of 3D X-ray microscopes (XRM) offers turnkey solutions for non-destructive 3D imaging of a wide variety of industrial and scientific applications. This includes defect detection in casting, machining and additive manufacturing, inspection of complex electro-mechanical assemblies, pharmaceutical packaging, advanced medical tools, porosity and grain size analysis in geological samples, and in-situ microscopy.
A new dimension for microscopy
Bruker 3D X-ray Microscopes (XRM) combine micro-computed tomography (micro-ct) hardware with specialized software into a complete microscopic visualization solution. Ranging from micro-resolution benchtops to nano-resolution floor standing instruments, Bruker XRM solutions provide the perfect balance of ease-of-use and power.
From measuring the porosity in geological specimens to the thickness of multiple coatings on pharmaceutical tablets or the on-chip and board level interconnect structure of circuits, XRM allows rapid multiscale analysis. The non-destructive nature of XRM allows validation of component integrity bringing QC of manufacturing techniques such as additive manufacturing to a new level.
Bruker’s software provides simple push button interfaces for technicians and novice researchers and exceptional depth for experts looking to push the boundaries of their samples and the technique. Reconstruction is accomplished with the latest GPU driven algorithms providing results from large datasets in a fraction of the time. The included analysis package allows both qualitative visualizations and quantitative regressions.
Which XRM is right for you?
Materials Science XRM Specifications
| Specification | SKYSCAN 1275 | SKYSCAN 1272 CMOS | SKYSCAN 1273 | SKYSCAN 2214 CMOS |
|---|---|---|---|---|
| Exterior dimensions (w x d x h, mm) | 1040 x 665 x 400 | 1160 x 520 x 330 | 1250 x 820 x 815 | 1800 x 950 x 1680 |
| Weight (without optional electronics) | 170 kg | 150 kg | 400 kg | 1500 kg |
| Source | 40-100 kV | 40-100 kV | 40-130 kV | 20-160 kV |
| Detector | 3 Mp Flat Panel | 16 Mp CMOS | 6 Mp Flat Panel | 6 Mp Flat Panel 16 Mp large CMOS 16 Mp mid CMOS 15 Mp hi-res CMOS |
| Max Sample Size (Diam, Height) | 96 mm, 120 mm | 75 mm, 80 mm | 300 mm, 500 mm | 300 mm, 400 mm |
| Minimum Resolution (Voxel, Spatial) | <4 µm, <8 µm | <0.45 µm, <5 µm | <3 µm, <6 µm | 60 nm, <500 nm |
| Measurement, Reconstruction and Analysis Software | Included | Included | Included | Included |
POSITION, SCAN, RECONSTRUCT…
Position
Real time view of the sample and actively updated default scan parameters allow fast scan setup.
Scan
Radiographs can be seen in real time allowing measurement monitoring. Measurements can be batched to ensure full system utilization.
NRECON
GPU driven, cutting edge algorithm results in 3D model reconstruction in a fraction of the traditional computing time.
… and ANALYZE
Webinars
XRM Facility in Belgium and our Virtual Showroom
Visit the demo facilities in our headquarters in Karlsruhe (Germany) and Kontich (Belgium) or just take a virtual tour in our showrooms to see and learn more about our analytical solutions. If you have any questions, please do not hesitate to contact our team of experts from sales or customer support.
XRM
Bruker Belgium
Kartuizersweg 3B,
2550 Kontich, Belgium