IEEE Transactions on Reliability, Volume 56 (original) (raw)

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Volume 56, Number 1, March 2007

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    Jason W. Rupe:
    Editorial - IEEE Editors Survey on the Features of Accepted Papers. 2-9
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    Yi-Kuei Lin:
    Reliability of a Flow Network Subject to Budget Constraints. 10-16
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    Yi-Kuei Lin:
    System Reliability of a Limited-Flow Network in Multicommodity Case. 17-25
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    Manju Agarwal, Kanwar Sen, Pooja Mohan:
    GERT Analysis of m-Consecutive-k-Out-of-n Systems. 26-34
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    Serkan Eryilmaz:
    On the Lifetime Distribution of Consecutive -out-of-n: F System. 35-39
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    Huairui Guo, Haitao Liao, Wenbiao Zhao, Adamantios Mettas:
    A New Stochastic Model for Systems Under General Repairs. 40-49
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    Kin-Ping Hui:
    Monte Carlo Network Reliability Ranking Estimation. 50-57
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    Liudong Xing:
    Reliability Evaluation of Phased-Mission Systems With Imperfect Fault Coverage and Common-Cause Failures. 58-68
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    Wei-Ting Kary Chien, Siyuan Frank Yang:
    A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. 69-76
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    Chenhua Li, Nasser Fard:
    Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data. 77-84
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    Francis G. Pascual:
    Accelerated Life Test Planning With Independent Weibull Competing Risks With Known Shape Parameter. 85-93
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    J. Onishi, S. Kimura, Ross J. W. James, Yuji Nakagawa:
    Solving the Redundancy Allocation Problem With a Mix of Components Using the Improved Surrogate Constraint Method. 94-101
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    B. M. Golam Kibria, Saralees Nadarajah:
    Reliability Modeling: Linear Combination and Ratio of Exponential and Rayleigh. 102-105
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    Furong Tan, Zhibin Jiang, Suk Joo Bae:
    Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems. 106-114
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    Noyan Turkkan, Thu Pham-Gia:
    System Stress-Strength Reliability: The Multivariate Case. 115-124
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    J. Nierwinski:
    Reliability Sampling Methodology Using Simulation and Re-Sampling. 125-131
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    Ammar M. Sarhan:
    Analysis of Incomplete, Censored Data in Competing Risks Models With Generalized Exponential Distributions. 132-138
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    Le-Ren Chang-Chien, Yin-Juin Lin, Chin-Chung Wu:
    A Real-Time Contingency Reserve Scheduling for an Isolated Power System. 139-147
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    Gregory Levitin:
    Optimal Defense Strategy Against Intentional Attacks. 148-157
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    Massimiliano Giorgio, Maurizio Guida, Gianpaolo Pulcini:
    A Wear Model for Assessing the Reliability of Cylinder Liners in Marine Diesel Engines. 158-166
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    Jason W. Rupe:
    Review of Optimal Reliability Design, Fundamentals and Applications. 167
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    Jason W. Rupe:
    Review of Reliability of Large Scale Systems. 167-168
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    Way Kuo:
    Corrections to "Challenges Related to Reliability in Nano Electronics". 169

Volume 56, Number 2, June 2007

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    Way Kuo:
    Editorial: How Reliable is Teaching Evaluation? The Relationship of Class Size to Teaching Evaluation Scores. 178-181
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    George R. Roelke, Rusty O. Baldwin, Barry E. Mullins, Yong C. Kim:
    A Cache Architecture for Extremely Unreliable Nanotechnologies. 182-197
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    Chin-Yu Huang, Sy-Yen Kuo, Michael R. Lyu:
    An Assessment of Testing-Effort Dependent Software Reliability Growth Models. 198-211
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    Taghi M. Khoshgoftaar, Kehan Gao:
    Count Models for Software Quality Estimation. 212-222
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    Kehan Gao, Taghi M. Khoshgoftaar:
    A Comprehensive Empirical Study of Count Models for Software Fault Prediction. 223-236
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  Taghi M. Khoshgoftaar, Yi Liu:
  A Multi-Objective Software Quality Classification Model Using Genetic Programming. 237-245
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    Babu Zachariah, R. N. Rattihalli:
    Failure Size Proportional Models and an Analysis of Failure Detection Abilities of Software Testing Strategies. 246-253
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    Changcheng Huang, Minzhe Li, Anand Srinivasan:
    A Scalable Path Protection Mechanism for Guaranteed Network Reliability Under Multiple Failures. 254-267
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    Li Bai:
    Generalized Access Structure Congestion System. 268-274
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    Dirk P. Kroese, Kin-Ping Hui, Sho Nariai:
    Network Reliability Optimization via the Cross-Entropy Method. 275-287
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    Sy-Yen Kuo, Fu-Min Yeh, Hung-Yau Lin:
    Efficient and Exact Reliability Evaluation for Networks With Imperfect Vertices. 288-300
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    Narayanaswamy Balakrishnan, Arezou Habibi Rad, Naser Reza Arghami:
    Testing Exponentiality Based on Kullback-Leibler Information With Progressively Type-II Censored Data. 301-307
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    Theodora Dimitrakopoulou, Konstantinos Adamidis, Sotirios Loukas:
    A Lifetime Distribution With an Upside-Down Bathtub-Shaped Hazard Function. 308-311
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    Ammar M. Sarhan, Frank M. Guess, John S. Usher:
    Estimators for Reliability Measures in Geometric Distribution Model Using Dependent Masked System Life Test Data. 312-320
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    Yefim Haim Michlin, Genady Grabarnik:
    Sequential Testing for Comparison of the Mean Time Between Failures for Two Systems. 321-331
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    Ali Haj Shirmohammadi, Zhe George Zhang, Ernie Love:
    A Computational Model for Determining the Optimal Preventive Maintenance Policy With Random Breakdowns and Imperfect Repairs. 332-339
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    Zehui Li, Peng Zhao:
    Reliability Analysis on the delta-Shock Model of Complex Systems. 340-348
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    Michael J. LuValle:
    Identifying Mechanisms That Highly Accelerated Tests Miss. 349-359
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    Juan A. Carrasco:
    Corrections on "Failure Transition Distance-Based Importance Sampling Schemes for the Simulation of Repairable Fault-Tolerant Computer Systems" [Jun 06 207-236]. 360
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    Mark P. Kaminskiy, Vasiliy V. Krivtsov, Saralees Nadarajah:
    Erratum [Dec 05 612-616]. 360

Volume 56, Number 3, September 2007

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    Way Kuo, Jason W. Rupe:
    R-Impact: Reliability-Based Citation Impact Factor. 366-367
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    Min-Hsiung Hsieh, Shuen-Lin Jeng:
    Accelerated Discrete Degradation Models for Leakage Current of Ultra-Thin Gate Oxides. 369-380
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    Chong Zhao, Xiaoliang Bai, Sujit Dey:
    Evaluating Transient Error Effects in Digital Nanometer Circuits. 381-391
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    Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam:
    Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. 392-400
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    Shuen-Lin Jeng, Jye-Chyi Lu, Kaibo Wang:
    A Review of Reliability Research on Nanotechnology. 401-410
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    Wen-Li Wang, Thomas L. Hemminger, Mei-Huei Tang:
    A Moving Average Non-Homogeneous Poisson Process Reliability Growth Model to Account for Software with Repair and System Structures. 411-421
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    Eduardo Oliveira Costa, Gustavo A. de Souza, Aurora Trinidad Ramirez Pozo, Silvia Regina Vergilio:
    Exploring Genetic Programming and Boosting Techniques to Model Software Reliability. 422-434
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    Lixuan Lu, Jin Jiang:
    Joint Failure Importance for Noncoherent Fault Trees. 435-443
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    Yuan-Shun Dai, Gregory Levitin:
    Optimal Resource Allocation for Maximizing Performance and Reliability in Tree-Structured Grid Services. 444-453
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    Hoang Pham, Chin-Diew Lai:
    On Recent Generalizations of the Weibull Distribution. 454-458
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    William J. Owen:
    An Exponential Damage Model for Strength of Fibrous Composite Materials. 459-463
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    Albert F. Myers:
    k-out-of-n: G System Reliability With Imperfect Fault Coverage. 464-473
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    Jose Emmanuel Ramirez-Marquez, Bethel A. Gebre:
    A Classification Tree Based Approach for the Development of Minimal Cut and Path Vectors of a Capacitated Network. 474-487
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    Weichang Yeh:
    A Simple Heuristic Algorithm for Generating All Minimal Paths. 488-494
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    Li Bai, Fan Zheng:
    Ternary State Circular Sequential k-out-of-n Congestion System. 495-505
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    Gary Hardy, Corinne Lucet, Nikolaos Limnios:
    K-Terminal Network Reliability Measures With Binary Decision Diagrams. 506-515
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    Xian Zhao, Lirong Cui, Way Kuo:
    Reliability for Sparsely Connected Consecutive-k Systems. 516-524
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    Gerard L. Reijns, Arjan J. C. van Gemund:
    Reliability Analysis of Hierarchical Systems Using Statistical Moments. 525-533
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    Bhupender Parashar, Gulshan Taneja:
    Reliability and Profit Evaluation of a PLC Hot Standby System Based on a Master-Slave Concept and Two Types of Repair Facilities. 534-539
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    Dazhi Wang, Kishor S. Trivedi:
    Reliability Analysis of Phased-Mission System With Independent Component Repairs. 540-551
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    Shaomin Wu, Min Xie:
    Classifying Weak, and Strong Components Using ROC Analysis With Application to Burn-In. 552-561
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    Tsong Yueh Chen, Robert G. Merkel:
    Quasi-Random Testing. 562-568
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    Hai-Yan Xu, He-Liang Fei:
    Planning Step-Stress Accelerated Life Tests With Two Experimental Variables. 569-579

Volume 56, Number 4, December 2007

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    Way Kuo:
    Compatibility and Simplicity: The Fundamentals of Reliability. 585-586
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    Jérôme Collet:
    Correction to "Some Remarks on Rare-Event Approximation". 587
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    Ming-Wei Wu, Yi-Min Wang, Sy-Yen Kuo, Yennun Huang:
    Self-Healing Spyware: Detection, and Remediation. 588-596
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    Long Wang, Zbigniew Kalbarczyk, Weining Gu, Ravishankar K. Iyer:
    Reliability MicroKernel: Providing Application-Aware Reliability in the OS. 597-614
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    Günther A. Hoffmann, Kishor S. Trivedi, Miroslaw Malek:
    A Best Practice Guide to Resource Forecasting for Computing Systems. 615-628
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    Y. P. Wu, Q. P. Hu, Min Xie, Szu Hui Ng:
    Modeling and Analysis of Software Fault Detection and Correction Process by Considering Time Dependency. 629-642
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    W. Douglas Obal II, Michael G. McQuinn, William H. Sanders:
    Detecting and Exploiting Symmetry in Discrete-State Markov Models. 643-654

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