Bayesian Class-Matched Multinet Classifier (original) (raw)

Abstract

A Bayesian multinet classifier allows a different set of independence assertions among variables in each of a set of local Bayesian networks composing the multinet. The structure of the local network is usually learned using a joint-probability-based score that is less specific to classification, i.e., classifiers based on structures providing high scores are not necessarily accurate. Moreover, this score is less discriminative for learning multinet classifiers because generally it is computed using only the class patterns and avoiding patterns of the other classes. We propose the Bayesian class-matched multinet (BCM2) classifier to tackle both issues. The BCM2 learns each local network using a detection-rejection measure, i.e., the accuracy in simultaneously detecting class patterns while rejecting patterns of the other classes. This classifier demonstrates superior accuracy to other state-of-the-art Bayesian network and multinet classifiers on 32 real-world databases.

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Authors and Affiliations

  1. Pattern Analysis and Machine Learning Lab, Department of Electrical & Computer Engineering, Ben-Gurion University, Beer-Sheva, 84105, Israel
    Yaniv Gurwicz & Boaz Lerner

Authors

  1. Yaniv Gurwicz
  2. Boaz Lerner

Editor information

Editors and Affiliations

  1. Hong Kong University of Science and Technology,
    Dit-Yan Yeung
  2. Department of Computer Science, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
    James T. Kwok
  3. Instituto de Telecomunicações, Instituto Superior Técnico, Lisbon, Portugal
    Ana Fred
  4. Department of Electrical and Electronic Engineering, University of Cagliari, Piazza d’Armi, 09123, Cagliari, Italy
    Fabio Roli
  5. Faculty of Electrical Engineering, Mathematics and Computer Science, Information and Communication Theory Group, Delft University of Technology, Delft, The Netherlands
    Dick de Ridder

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© 2006 Springer-Verlag Berlin Heidelberg

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Gurwicz, Y., Lerner, B. (2006). Bayesian Class-Matched Multinet Classifier. In: Yeung, DY., Kwok, J.T., Fred, A., Roli, F., de Ridder, D. (eds) Structural, Syntactic, and Statistical Pattern Recognition. SSPR /SPR 2006. Lecture Notes in Computer Science, vol 4109. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11815921\_15

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