Polarized photocurrent response in black phosphorus field-effect transistors (original) (raw)

Author affiliations

* Corresponding authors

a Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, TN 37235, USA
E-mail: yaqiong.xu@vanderbilt.edu

b Department of Physics and Astronomy, Wayne State University, Detroit, MI 48201, USA
E-mail: zxzhou@wayne.edu

c Center of Nanophase Materials Sciences, Oak Ridge National Laboratory, TN 37831, USA
E-mail: panm@ornl.gov

d Department of Physics and Astronomy, Vanderbilt University, Nashville, TN 37235, USA

Abstract

We investigate electrical transport and optoelectronic properties of field effect transistors (FETs) made from few-layer black phosphorus (BP) crystals down to a few nanometers. In particular, we explore the anisotropic nature and photocurrent generation mechanisms in BP FETs through spatial-, polarization-, gate-, and bias-dependent photocurrent measurements. Our results reveal that the photocurrent signals at BP-electrode junctions are mainly attributed to the photovoltaic effect in the off-state and photothermoelectric effect in the on-state, and their anisotropic feature primarily results from the directional-dependent absorption of BP crystals.

Graphical abstract: Polarized photocurrent response in black phosphorus field-effect transistors

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Article information

DOI

https://doi.org/10.1039/C4NR02164A

Article type

Paper

Submitted

21 Apr 2014

Accepted

06 Jun 2014

First published

11 Jun 2014

Download Citation

Nanoscale, 2014,6, 8978-8983

Author version available

Permissions

Polarized photocurrent response in black phosphorus field-effect transistors

T. Hong, B. Chamlagain, W. Lin, H. Chuang, M. Pan, Z. Zhou and Y. Xu,Nanoscale, 2014, 6, 8978DOI: 10.1039/C4NR02164A

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