ext) on the test quality and test time of STT-MRAMs, which could be achieved by integrating one or more magnets in the Automated Test Equipment (ATE) setup. A framework for these so-called Hext-assisted tests is presented and implemented for all known conventional and unique defects. The paper demonstrates that the Hext-assisted tests offer superior coverage and/or lower test time compared to regular functional tests, like march tests. The effectiveness of these tests are validated through silicon measurements.">

Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? (original) (raw)

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