Suppose we are given a vector $f$ in a class ${\cal F} \subset{\BBR}^N$, e.g., a class of digital signals or digital images. How many linear measurements do we need to make about $f$ to be able to recover $f$ to within precision $\epsilon$ in the Euclidean $(\ell_2)$ metric? This paper shows that if the objects of interest are sparse in a fixed basis or compressible, then it is possible to reconstruct $f$ to within very high accuracy from a small number of random measurements by solving a simple linear program. More precisely, suppose that the $n$th largest entry of the vector $\vert f\vert$ (or of its coefficients in a fixed basis) obeys $\vert f\vert _{(n)} \le R \cdot n^{-1/p}$, where $R > 0$ and $p > 0$. Suppose that we take measurements $y_k = \langle f, X_k\rangle, k = 1, \ldots, K$ , where the $X_k$ are $N$-dimensional Gaussian vectors with independent standard normal entries. Then for each $f$ obeying the decay estimate above for some $0 < p < 1$ and with overwhelming probability, our reconstruction $f^\sharp$, defined as the solution to the constraints $y_k = \langle f^\sharp, X_k \rangle$ with minimal $\ell_1$ norm, obeys $$ \Vert f - f^\sharp\Vert _{\ell_2} \le C_p \cdot R \cdot (K/\log N)^{-r}, \quad r = 1/p - 1/2. $$ There is a sense in which this result is optimal; it is generally impossible to obtain a higher accuracy from any set of $K$ measurements whatsoever. The methodology extends to various other random measurement ensembles; for example, we show that similar results hold if one observes a few randomly sampled Fourier coefficients of $f$ . In fact, the results are quite general and require only two hypotheses on the measurement ensemble which are detailed. ">

Near-Optimal Signal Recovery From Random Projections: Universal Encoding Strategies? (original) (raw)

IEEE Account

Purchase Details

Profile Information

Need Help?

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2026 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.