Index of refraction of sapphire between 24 and 1060°C for wavelengths of 633 and 799 nm (original) (raw)
- Journal of the Optical Society of America A
- Vol. 3,
- Issue 5,
- pp. 610-616
- (1986)
- •https://doi.org/10.1364/JOSAA.3.000610
Author Information
Author Affiliations
J. Tapping1*and M. L. Reilly2
1Radiometric Physics Division, Center for Radiation Research, National Bureau of Standards, Gaithersburg, Maryland 20899 USA
2Temperature and Pressure Division, Center for Basic Standards, National Bureau of Standards, Gaithersburg, Maryland 20899 USA
*Present address, Division of Applied Physics, CSIRO, P.O. Box 218, Linfield, New South Wales 2070, Australia.
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Abstract
The index of refraction of the ordinary ray in sapphire for temperatures from 24 to 1060°C and for wavelengths of 633 and 799 nm was found to be expressed to 0.02% (99% confidence level) by n S(T)633nm = 1.76565 + 1.258 × 10−5_T_ + 4.06 × 10−9_T_2 and n S(T)799nm = 1.75991 + 1.229 × 10−5_T_ + 3.10 × 10−9_T_2 where T is the temperature in degrees Celsius. These expressions were calculated from measurements of the relative change with temperature in the reflectance for a plane surface normal to the c axis of single-crystal sapphire.
© 1986 Optical Society of America
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