Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry (original) (raw)

Author Affiliations

Qinghao Ye, Chris Xu, Xiang Liu, Wayne H. Knox, Man F. Yan, Robert S. Windeler, and Benjamin Eggleton

Q. Ye (yeqh5@online.sh.cn) is with the Department of Physics, Shanghai Jiao Tong University, Shanghai 200030, China.

When this research was performed, C. Xu, X. Liu, and W. H. Knox were with Bell Laboratories, Lucent Technologies, 101 Crawfords Corner Road, Holmdel, New Jersey 07733.

W. H. Knox is now with The Institute of Optics, University of Rochester, Rochester, New York 14627.

M. F. Yan, R. S. Windeler, and B. Eggleton are with Bell Laboratories, Lucent Technologies, 700 Mountain Avenue, Murray Hill, New Jersey 07974.