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Ayushi Trivedi

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Papers by Ayushi Trivedi

Research paper thumbnail of Labeling elemental detection sensitivities in part per billion range using conventional geometry synchrotron assisted EDXRF measurements

Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro... more Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro and trace multi-element analysis of materials. Conventional trials show that using laboratory assisted EDXRF measurements, one can obtain elemental detection limits in the range of μg/g to sub-μg/g level. In the present work a quantitative approach has been followed in attempting to explore how is it possible to obtain elemental detection limit in the range of ng/g by using simple EDXRF excitation (45°45° geometry) instead of using total reflection X-ray fluorescence (TXRF) technique, which renders relatively superior detection limits for different elements. In order to accomplish this, we recorded fluorescence spectrum from a standard reference sample (ICP-IV) in similar experimental conditions. The results show that using a very small quantity of sample on top of a thin kapton foil with a thickness ranging between 25-50 μm, as a sample carrier, the EDXRF technique may offer comparable...

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Research paper thumbnail of Improvement of limit of detection sensitivities in the parts per billion range using conventional geometry synchrotron radiation excited EDXRF measurements

Journal of Analytical Atomic Spectrometry, 2022

The use of a thin polymer foil as a sample carrier in the EDXRF technique may provide elemental d... more The use of a thin polymer foil as a sample carrier in the EDXRF technique may provide elemental detection limits comparable to the TXRF technique.

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Research paper thumbnail of Depth profiling of energetic Au ions inside P-type Si 100> substrate

Applied Surface Science, 2021

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Research paper thumbnail of Surface‐interface investigations of an ultrathin pulsed laser deposited NiO/ZnO bilayer structure

Surface and Interface Analysis, 2020

We hereby report detailed structural and morphological studies for an ultrathin NiO/ZnO bilayer s... more We hereby report detailed structural and morphological studies for an ultrathin NiO/ZnO bilayer structure grown on sapphire (001) substrate using pulsed laser deposition technique. The combined X‐ray reflectivity (XRR) and grazing incidence X‐ray fluorescence (GIXRF) studies revealed formation of a low‐density defective ZnO interfacial layer of thickness ~32 Å at the ZnO/sapphire interface prior to growth of main ZnO layer. Our results further indicate that the variation of electron density across the NiO/ZnO bilayer structure is smooth and we do not observe presence of any interface layer between them. X‐ray diffraction measurements show that deposited ZnO layer is epitaxial in nature whereas NiO is highly oriented along (100) direction. The angle dependent X‐ray absorption near edge fine structure (XANES) measurements at Ni–K edge has been utilized to determine depth‐resolved oxidation state of Ni and the results have been correlated with the depth‐resolved electron density of NiO layer. The method described here offers nondestructive determination of the microstructural parameters as well as depth‐resolved mapping of oxidation state of a thin film‐based heterojunction device. It extends several advantages over destructive methods which are abundantly reported in literature.

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Research paper thumbnail of Determination of arsenic diffusion in PLD grown ZnO thin films using synchrotron based XRR-GIXRF measurements

DAE SOLID STATE PHYSICS SYMPOSIUM 2018, 2019

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Research paper thumbnail of Study of energy dependent behaviour of half-lens polycapillary optics using synchrotron x-rays

DAE SOLID STATE PHYSICS SYMPOSIUM 2019, 2020

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Research paper thumbnail of Labeling elemental detection sensitivities in part per billion range using conventional geometry synchrotron assisted EDXRF measurements

Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro... more Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro and trace multi-element analysis of materials. Conventional trials show that using laboratory assisted EDXRF measurements, one can obtain elemental detection limits in the range of μg/g to sub-μg/g level. In the present work a quantitative approach has been followed in attempting to explore how is it possible to obtain elemental detection limit in the range of ng/g by using simple EDXRF excitation (45°45° geometry) instead of using total reflection X-ray fluorescence (TXRF) technique, which renders relatively superior detection limits for different elements. In order to accomplish this, we recorded fluorescence spectrum from a standard reference sample (ICP-IV) in similar experimental conditions. The results show that using a very small quantity of sample on top of a thin kapton foil with a thickness ranging between 25-50 μm, as a sample carrier, the EDXRF technique may offer comparable...

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Improvement of limit of detection sensitivities in the parts per billion range using conventional geometry synchrotron radiation excited EDXRF measurements

Journal of Analytical Atomic Spectrometry, 2022

The use of a thin polymer foil as a sample carrier in the EDXRF technique may provide elemental d... more The use of a thin polymer foil as a sample carrier in the EDXRF technique may provide elemental detection limits comparable to the TXRF technique.

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Depth profiling of energetic Au ions inside P-type Si 100> substrate

Applied Surface Science, 2021

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Surface‐interface investigations of an ultrathin pulsed laser deposited NiO/ZnO bilayer structure

Surface and Interface Analysis, 2020

We hereby report detailed structural and morphological studies for an ultrathin NiO/ZnO bilayer s... more We hereby report detailed structural and morphological studies for an ultrathin NiO/ZnO bilayer structure grown on sapphire (001) substrate using pulsed laser deposition technique. The combined X‐ray reflectivity (XRR) and grazing incidence X‐ray fluorescence (GIXRF) studies revealed formation of a low‐density defective ZnO interfacial layer of thickness ~32 Å at the ZnO/sapphire interface prior to growth of main ZnO layer. Our results further indicate that the variation of electron density across the NiO/ZnO bilayer structure is smooth and we do not observe presence of any interface layer between them. X‐ray diffraction measurements show that deposited ZnO layer is epitaxial in nature whereas NiO is highly oriented along (100) direction. The angle dependent X‐ray absorption near edge fine structure (XANES) measurements at Ni–K edge has been utilized to determine depth‐resolved oxidation state of Ni and the results have been correlated with the depth‐resolved electron density of NiO layer. The method described here offers nondestructive determination of the microstructural parameters as well as depth‐resolved mapping of oxidation state of a thin film‐based heterojunction device. It extends several advantages over destructive methods which are abundantly reported in literature.

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Determination of arsenic diffusion in PLD grown ZnO thin films using synchrotron based XRR-GIXRF measurements

DAE SOLID STATE PHYSICS SYMPOSIUM 2018, 2019

Bookmarks Related papers MentionsView impact

Research paper thumbnail of Study of energy dependent behaviour of half-lens polycapillary optics using synchrotron x-rays

DAE SOLID STATE PHYSICS SYMPOSIUM 2019, 2020

Bookmarks Related papers MentionsView impact

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