Kamel Rekab - Academia.edu (original) (raw)
Papers by Kamel Rekab
CRC Press eBooks, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
... James-Stein and Ridge Regression Estimators, Marvin HJ Gruber Nonparametric Regression and Sp... more ... James-Stein and Ridge Regression Estimators, Marvin HJ Gruber Nonparametric Regression and Spline Smoothing: Second Edition, Randall L. Eubank ... Silva, Mark Pauls, Glenn Hess, Young-chan Lee, Eric Li, Dale Means, Mark Phelps, Thomas Sanders, Shoaib Shaikh, and ...
Biometrics & Biostatistics International Journal, May 13, 2019
For estimating the product of two means from the general one parameter exponential family, we con... more For estimating the product of two means from the general one parameter exponential family, we consider a fully Bayesian approach with conjugate priors. We derive a sharp lower bound for the Bayes Risk. We also propose a fully sequential design with an incurred Bayes Risk near the second order lower bound. An application to reliability estimation is performed analytically and through Monte Carlo simulation.
CRC Press eBooks, Apr 8, 2005
Biometrics & Biostatistics International Journal, Jun 2, 2023
Utilizing the data for 5-year high risk and 10-year high risk, we replicated the logistic models ... more Utilizing the data for 5-year high risk and 10-year high risk, we replicated the logistic models for Static 99R. Subsequently, we
Statistics, a series of textbooks and monographs, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
Statistics, a series of textbooks and monographs, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
Statistics, a series of textbooks and monographs, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
Ahmed M. Salem. (2001). se testing.
In any non-trivial software system, reliability cannot be determined exactly. Instead, we must ap... more In any non-trivial software system, reliability cannot be determined exactly. Instead, we must apply statistical methods to create an estimate based on a sample of test cases. This dissertation introduces such an estimate which involves partitioning the population of test cases and selecting samples from within these partitions. These estimates are, however, are bound by constraints on the time and money that an organization is willing to expend to attain them. In this work, two specific constraints are considered, and for each constraint, iterative approaches to test selection are discussed with the goal being to create the most accurate reliability prediction possible given the relevant constraint. In contrast to fixed sampling schemes, where the proportion of test cases taken from each partition is determined before reliability testing begins, we make allocation decisions dynamically throughout the testing process. Using a Bayesian approach, we can take advantage of information from previous functional testing and insights from developers. We then refine these estimates in an iterative manner as we sample. Here we compare the results of our sequential sampling schemes and demonstrate their superiority over the optimal fixed sampling scheme in terms of the Bayes risk both theoretically and through Monte Carlo simulations.
Abstract: In today's e-commerce world computer security is needed more than ever before. Att... more Abstract: In today's e-commerce world computer security is needed more than ever before. Attacks on computer networks are a serious problem. The constant increase of attacks against networks and their resources creates a necessity to protect these valuable assets. Because most ...
Microelectronics Reliability, Sep 1, 1996
Statistical simulation using design of experiments has been employed for integrated circuit techn... more Statistical simulation using design of experiments has been employed for integrated circuit technology development. A software program called STADIUM was developed to implement this statistical methodology. The software has been designed to be user friendly and to guide the engineer who is not a statistics expert through the process of deriving a valid statistical answer. Inputs to the STADIUM system include integrated circuit fabrication variations and when coupled with semiconductor process and device simulators can estimate the expected variations of device parameters such as transistor gain and threshold voltage. This paper presents the detailed, procedure and results of a statistical simulation of a bipolar transistor technology.
Statistics: A Series of Textbooks and Monographs, 2005
Statistics: A Series of Textbooks and Monographs, 2005
CRC Press eBooks, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
... James-Stein and Ridge Regression Estimators, Marvin HJ Gruber Nonparametric Regression and Sp... more ... James-Stein and Ridge Regression Estimators, Marvin HJ Gruber Nonparametric Regression and Spline Smoothing: Second Edition, Randall L. Eubank ... Silva, Mark Pauls, Glenn Hess, Young-chan Lee, Eric Li, Dale Means, Mark Phelps, Thomas Sanders, Shoaib Shaikh, and ...
Biometrics & Biostatistics International Journal, May 13, 2019
For estimating the product of two means from the general one parameter exponential family, we con... more For estimating the product of two means from the general one parameter exponential family, we consider a fully Bayesian approach with conjugate priors. We derive a sharp lower bound for the Bayes Risk. We also propose a fully sequential design with an incurred Bayes Risk near the second order lower bound. An application to reliability estimation is performed analytically and through Monte Carlo simulation.
CRC Press eBooks, Apr 8, 2005
Biometrics & Biostatistics International Journal, Jun 2, 2023
Utilizing the data for 5-year high risk and 10-year high risk, we replicated the logistic models ... more Utilizing the data for 5-year high risk and 10-year high risk, we replicated the logistic models for Static 99R. Subsequently, we
Statistics, a series of textbooks and monographs, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
Statistics, a series of textbooks and monographs, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
Statistics, a series of textbooks and monographs, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
CRC Press eBooks, Apr 8, 2005
Ahmed M. Salem. (2001). se testing.
In any non-trivial software system, reliability cannot be determined exactly. Instead, we must ap... more In any non-trivial software system, reliability cannot be determined exactly. Instead, we must apply statistical methods to create an estimate based on a sample of test cases. This dissertation introduces such an estimate which involves partitioning the population of test cases and selecting samples from within these partitions. These estimates are, however, are bound by constraints on the time and money that an organization is willing to expend to attain them. In this work, two specific constraints are considered, and for each constraint, iterative approaches to test selection are discussed with the goal being to create the most accurate reliability prediction possible given the relevant constraint. In contrast to fixed sampling schemes, where the proportion of test cases taken from each partition is determined before reliability testing begins, we make allocation decisions dynamically throughout the testing process. Using a Bayesian approach, we can take advantage of information from previous functional testing and insights from developers. We then refine these estimates in an iterative manner as we sample. Here we compare the results of our sequential sampling schemes and demonstrate their superiority over the optimal fixed sampling scheme in terms of the Bayes risk both theoretically and through Monte Carlo simulations.
Abstract: In today's e-commerce world computer security is needed more than ever before. Att... more Abstract: In today's e-commerce world computer security is needed more than ever before. Attacks on computer networks are a serious problem. The constant increase of attacks against networks and their resources creates a necessity to protect these valuable assets. Because most ...
Microelectronics Reliability, Sep 1, 1996
Statistical simulation using design of experiments has been employed for integrated circuit techn... more Statistical simulation using design of experiments has been employed for integrated circuit technology development. A software program called STADIUM was developed to implement this statistical methodology. The software has been designed to be user friendly and to guide the engineer who is not a statistics expert through the process of deriving a valid statistical answer. Inputs to the STADIUM system include integrated circuit fabrication variations and when coupled with semiconductor process and device simulators can estimate the expected variations of device parameters such as transistor gain and threshold voltage. This paper presents the detailed, procedure and results of a statistical simulation of a bipolar transistor technology.
Statistics: A Series of Textbooks and Monographs, 2005
Statistics: A Series of Textbooks and Monographs, 2005