Marco Bellini - Academia.edu (original) (raw)
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Papers by Marco Bellini
2011 International Conference on Simulation of Semiconductor Processes and Devices, 2011
A SRH model with temperature-dependent capture cross-sections is proposed for a better accuracy o... more A SRH model with temperature-dependent capture cross-sections is proposed for a better accuracy of TCAD simulations of combined ion and electron irradiated power diodes over a large temperature range. A robust procedure is proposed for the identification of the model parameters of deep levels on the basis of static and dynamic diode measurements.
2011 International Conference on Simulation of Semiconductor Processes and Devices, 2011
A SRH model with temperature-dependent capture cross-sections is proposed for a better accuracy o... more A SRH model with temperature-dependent capture cross-sections is proposed for a better accuracy of TCAD simulations of combined ion and electron irradiated power diodes over a large temperature range. A robust procedure is proposed for the identification of the model parameters of deep levels on the basis of static and dynamic diode measurements.