Octavian Mocanu - Academia.edu (original) (raw)
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Papers by Octavian Mocanu
Journal of Electronic Testing, 1999
We present a high qualitative reconfigurability method for fault-tolerant memory systems against ... more We present a high qualitative reconfigurability method for fault-tolerant memory systems against radiation influence on semiconductors. Its novelty lies in a joint failure repair mechanism. It uses a concurrent on-line technique based on asynchronous built-in current sensors (BICS), parity check and cold spare modules against electrical abnormal behaviour due to latch-up (LU), and the Hamming SEC code to counterattack single
IEEE International Workshop on IDDQ Testing, 1998
We propose a new type of BIC sensor (SD BICS) with the properties described. The sensors work wit... more We propose a new type of BIC sensor (SD BICS) with the properties described. The sensors work with analog circuits, continuously monitoring a given current. As a particular case, the self-disconnecting BICS (SD BICS) can be applied to digital circuits. The values of the current sensibility are programmable, both at design and functioning time. They are self-disconnecting/connecting, meaning that whether
Neurocomputing, 2000
This paper describes a mathematical model of the axon of the cerebellar granule cell as it ascend... more This paper describes a mathematical model of the axon of the cerebellar granule cell as it ascends into the molecular layer and branches into its two parallel fiber segments. We present a theoretical and computational analysis of the input resistance at the branching point and the degree ...
Journal of Electronic Testing, 1999
We present a high qualitative reconfigurability method for fault-tolerant memory systems against ... more We present a high qualitative reconfigurability method for fault-tolerant memory systems against radiation influence on semiconductors. Its novelty lies in a joint failure repair mechanism. It uses a concurrent on-line technique based on asynchronous built-in current sensors (BICS), parity check and cold spare modules against electrical abnormal behaviour due to latch-up (LU), and the Hamming SEC code to counterattack single
IEEE International Workshop on IDDQ Testing, 1998
We propose a new type of BIC sensor (SD BICS) with the properties described. The sensors work wit... more We propose a new type of BIC sensor (SD BICS) with the properties described. The sensors work with analog circuits, continuously monitoring a given current. As a particular case, the self-disconnecting BICS (SD BICS) can be applied to digital circuits. The values of the current sensibility are programmable, both at design and functioning time. They are self-disconnecting/connecting, meaning that whether
Neurocomputing, 2000
This paper describes a mathematical model of the axon of the cerebellar granule cell as it ascend... more This paper describes a mathematical model of the axon of the cerebellar granule cell as it ascends into the molecular layer and branches into its two parallel fiber segments. We present a theoretical and computational analysis of the input resistance at the branching point and the degree ...