S Rajathi - Academia.edu (original) (raw)
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Alagappa Govt. Arts College (Alagappa University), Karaikudi - 630003, Tamil Nadu, India
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Papers by S Rajathi
Advanced Materials Research, 2013
CdZnS thinfims have been prepared on mineral glass substrate by spray pyrolysis method at differe... more CdZnS thinfims have been prepared on mineral glass substrate by spray pyrolysis method at different deposition temperature using the optimized coating parameters. The XRD profile of the films confirms hexagonal wurtizite structure with preferred orientation along the (101) pane. The different crystallographic parameters viz., lattice constant, c/a ratio, mean grain size, number of reflections per unit area, lattice strain, dislocation density, texture coefficient and standard deviation have been calculated from the experimentally observed XRD data and the effect of deposition temperature on these parameters have been elaborately discussed. The maximum optical transmittance of 84.5% (at λ= 650 nm ) has been observed for the CdZnS thin film spray deposited at the temperature 450 °C. The direct band gap energy calculated from the transmittance measurements lies between 2.82 eV and 3.4 eV. The electrical resistivity has been found to be low with the value 50 x 103 Ω - cm for the film de...
Advanced Materials Research, 2013
Zinc Oxide thin films have been deposited on glass substrates at different spin rate by sol-gel s... more Zinc Oxide thin films have been deposited on glass substrates at different spin rate by sol-gel spin coating method. XRD measurement of the ZnO films confirms the Wurtzite hexagonal phase with the preferred orientation along the C-axis (002) plane. The other characteristic orientations (100) and (101) have also been observed. The average crystallite size evaluated from the XRD data lies between 5 nm and 20 nm. The crystallographic parameters viz., lattice constants, mean crystalline size, dislocation density, texture coefficient and standard deviation have been calculated from the XRD data. The estimated texture coefficient indicates the oriented overgrowth of (002) plane for the ZnO films spin coated up to the spin rate 3500 rpm. ZnO thinfilm spin coated at 4000 rpm and 3500 rpm shows maximum transmittance of 87.5% and 88.5 % respectively at 850 nm. The measured direct band gap energy of the ZnO films coated at different spin rates varies between 3 eV and 3.3 eV. The grain size obs...
Advanced Materials Research, 2013
CdZnS thinfims have been prepared on mineral glass substrate by spray pyrolysis method at differe... more CdZnS thinfims have been prepared on mineral glass substrate by spray pyrolysis method at different deposition temperature using the optimized coating parameters. The XRD profile of the films confirms hexagonal wurtizite structure with preferred orientation along the (101) pane. The different crystallographic parameters viz., lattice constant, c/a ratio, mean grain size, number of reflections per unit area, lattice strain, dislocation density, texture coefficient and standard deviation have been calculated from the experimentally observed XRD data and the effect of deposition temperature on these parameters have been elaborately discussed. The maximum optical transmittance of 84.5% (at λ= 650 nm ) has been observed for the CdZnS thin film spray deposited at the temperature 450 °C. The direct band gap energy calculated from the transmittance measurements lies between 2.82 eV and 3.4 eV. The electrical resistivity has been found to be low with the value 50 x 103 Ω - cm for the film de...
Advanced Materials Research, 2013
Zinc Oxide thin films have been deposited on glass substrates at different spin rate by sol-gel s... more Zinc Oxide thin films have been deposited on glass substrates at different spin rate by sol-gel spin coating method. XRD measurement of the ZnO films confirms the Wurtzite hexagonal phase with the preferred orientation along the C-axis (002) plane. The other characteristic orientations (100) and (101) have also been observed. The average crystallite size evaluated from the XRD data lies between 5 nm and 20 nm. The crystallographic parameters viz., lattice constants, mean crystalline size, dislocation density, texture coefficient and standard deviation have been calculated from the XRD data. The estimated texture coefficient indicates the oriented overgrowth of (002) plane for the ZnO films spin coated up to the spin rate 3500 rpm. ZnO thinfilm spin coated at 4000 rpm and 3500 rpm shows maximum transmittance of 87.5% and 88.5 % respectively at 850 nm. The measured direct band gap energy of the ZnO films coated at different spin rates varies between 3 eV and 3.3 eV. The grain size obs...