S. Visnovsky - Academia.edu (original) (raw)
Papers by S. Visnovsky
Czechoslovak Journal of Physics, 2006
The analytical formalism of Rokushima and Yamakita [J. Opt. Soc. Am. 73, 901–908 (1983)] treating... more The analytical formalism of Rokushima and Yamakita [J. Opt. Soc. Am. 73, 901–908 (1983)] treating the Fraunhofer diffraction in planar multilayered anisotropic gratings proved to be a useful introduction to new fundamental and practical situations encountered in laterally structured periodic (both isotropic and anisotropic) multilayer media. These are employed in the spectroscopic ellipsometry for modeling surface roughness and in-depth profiles,
Applied Physics Letters, 2012
![Research paper thumbnail of Magneto-Optical Properties of Interfaces in [NiO/α-Fe2O3]N and[α-Fe2O3/NiO]N Multilayers](https://attachments.academia-assets.com/66970326/thumbnails/1.jpg)
](Journal of the Magnetics Society of Japan, 1999
Journal of the Magnetics Society of Japan, 2001
Transactions of the Magnetics Society of Japan, 2004
Journal of the Magnetics Society of Japan, 1996
Optical Fabrication, Testing, and Metrology II, 2005
ABSTRACT Spectroscopic ellipsometry (SE) with microscopic measurement spot is applied to extract ... more ABSTRACT Spectroscopic ellipsometry (SE) with microscopic measurement spot is applied to extract geometrical parameters of a bi-periodic array of holes patterned on the top of an Si wafer, namely the holes' diameter and depth, while the period of the patterning is assumed same as the value intended by the manufacturer. The SE response of the structure is simulated by the rigorous coupled-wave analysis implemented as the Airy-like internal reflection series, whose detailed description for the case of 2D gratings is provided with a brief demonstration of its convergence properties. The result of the extraction by SE is compared with results obtained by scanning electron microscopy (SEM) with reasonable agreement. The difference between some of the SE, SEM, and nominal parameters are discussed and the possibility to increase the accuracy of SE-based metrology is suggested.
Journal of the Magnetics Society of Japan, 2006
[1993] Digests of International Magnetics Conference, 1993
ABSTRACT
Journal of Applied Physics, 2015
ABSTRACT Ferrimagnetic Zn-ferrite (ZnFe2O4) films can be grown with the ferromagnetic resonance l... more ABSTRACT Ferrimagnetic Zn-ferrite (ZnFe2O4) films can be grown with the ferromagnetic resonance linewidth of 40 Oe at 9.5 GHz without going through a high temperature processing. This presents interest for applications. The work deals with laser ablated ZnFe2O4 films deposited at O2 pressure of 0.16 mbar onto fused quartz substrates. The films about 120 nm thick are nanocrystalline and their spontaneous magnetization, 4πM s, depends on the nanograin size, which is controlled by the substrate temperature (T s). At T s ≈ 350 °C, where the grain distribution peaks around ∼20–30 nm, the room temperature 4πM s reaches a maximum of ∼2.3 kG. The films were studied by magnetooptical polar Kerr effect (MOKE) spectroscopy at photon energies between 1 and 5 eV. The complementary characteristics were provided by spectral ellipsometry (SE). Both the SE and MOKE spectra confirmed ferrimagnetic ordering. The structural details correspond to those observed in MgFe2O4 and Li0.5Fe2.5O4 spinels. SE experiments confirm the insulator behavior. The films display MOKE amplitudes somewhat reduced with respect to those in Li0.5Fe2.5O4 and MgFe2O4 due to a lower degree of spinel inversion and nanocrystalline structure. The results indicate that the films are free of oxygen vacancies and Fe3+-Fe2+ exchange.
IEEE International Magnetics Conference, 1999
Journal of Physics C: Solid State Physics, 1983
ABSTRACT
Journal de Physique, 1979
MRS Proceedings, 1991
ABSTRACTThe paper deals with the electromangetic theory of the optical interactions in planar mul... more ABSTRACTThe paper deals with the electromangetic theory of the optical interactions in planar multilayer (ML) structures displaying magnetic order. The main attention is focussed on the practically important configuration of normal incidence and polar magnetization in an originally isotropic medium. The procedure providing the information on the ML optical response is treated in detail. It assumes that the thickness and optical parameters in each layer entering the ML structure allong with the azimuth and ellipticity of the incident wave are given as the input data. The optical response is given in terms of the complex amplitudes of the reflected and transmitted waves from which the ML optical parameters, i.e. “Kerr” and “Faraday” effects, transmission, reflectivity, quality factor, etc., can be derived. The experience has shown that the procedure gives plausible results even for ML structures consisting of the layers the thicknesses of which are in the nanometer range, i. e. in the...
Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005
A new null ellipsometer has been recently proposed that uses photoelastic modulator (PEM). The ph... more A new null ellipsometer has been recently proposed that uses photoelastic modulator (PEM). The phase modulation adds a good signal-to-noise ratio, high sensitivity, and linearity near null positions to the traditional high-precision nulling system. The ellipsometric angles Delta and psi are obtained by azimuth measurement of the analyzer and the polarizer--PEM system, for which the first and second harmonics of
Science and Technology of Advanced Materials, 2014
Czechoslovak Journal of Physics, 2006
The analytical formalism of Rokushima and Yamakita [J. Opt. Soc. Am. 73, 901–908 (1983)] treating... more The analytical formalism of Rokushima and Yamakita [J. Opt. Soc. Am. 73, 901–908 (1983)] treating the Fraunhofer diffraction in planar multilayered anisotropic gratings proved to be a useful introduction to new fundamental and practical situations encountered in laterally structured periodic (both isotropic and anisotropic) multilayer media. These are employed in the spectroscopic ellipsometry for modeling surface roughness and in-depth profiles,
Applied Physics Letters, 2012
Journal of the Magnetics Society of Japan, 1999
Journal of the Magnetics Society of Japan, 2001
Transactions of the Magnetics Society of Japan, 2004
Journal of the Magnetics Society of Japan, 1996
Optical Fabrication, Testing, and Metrology II, 2005
ABSTRACT Spectroscopic ellipsometry (SE) with microscopic measurement spot is applied to extract ... more ABSTRACT Spectroscopic ellipsometry (SE) with microscopic measurement spot is applied to extract geometrical parameters of a bi-periodic array of holes patterned on the top of an Si wafer, namely the holes' diameter and depth, while the period of the patterning is assumed same as the value intended by the manufacturer. The SE response of the structure is simulated by the rigorous coupled-wave analysis implemented as the Airy-like internal reflection series, whose detailed description for the case of 2D gratings is provided with a brief demonstration of its convergence properties. The result of the extraction by SE is compared with results obtained by scanning electron microscopy (SEM) with reasonable agreement. The difference between some of the SE, SEM, and nominal parameters are discussed and the possibility to increase the accuracy of SE-based metrology is suggested.
Journal of the Magnetics Society of Japan, 2006
[1993] Digests of International Magnetics Conference, 1993
ABSTRACT
Journal of Applied Physics, 2015
ABSTRACT Ferrimagnetic Zn-ferrite (ZnFe2O4) films can be grown with the ferromagnetic resonance l... more ABSTRACT Ferrimagnetic Zn-ferrite (ZnFe2O4) films can be grown with the ferromagnetic resonance linewidth of 40 Oe at 9.5 GHz without going through a high temperature processing. This presents interest for applications. The work deals with laser ablated ZnFe2O4 films deposited at O2 pressure of 0.16 mbar onto fused quartz substrates. The films about 120 nm thick are nanocrystalline and their spontaneous magnetization, 4πM s, depends on the nanograin size, which is controlled by the substrate temperature (T s). At T s ≈ 350 °C, where the grain distribution peaks around ∼20–30 nm, the room temperature 4πM s reaches a maximum of ∼2.3 kG. The films were studied by magnetooptical polar Kerr effect (MOKE) spectroscopy at photon energies between 1 and 5 eV. The complementary characteristics were provided by spectral ellipsometry (SE). Both the SE and MOKE spectra confirmed ferrimagnetic ordering. The structural details correspond to those observed in MgFe2O4 and Li0.5Fe2.5O4 spinels. SE experiments confirm the insulator behavior. The films display MOKE amplitudes somewhat reduced with respect to those in Li0.5Fe2.5O4 and MgFe2O4 due to a lower degree of spinel inversion and nanocrystalline structure. The results indicate that the films are free of oxygen vacancies and Fe3+-Fe2+ exchange.
IEEE International Magnetics Conference, 1999
Journal of Physics C: Solid State Physics, 1983
ABSTRACT
Journal de Physique, 1979
MRS Proceedings, 1991
ABSTRACTThe paper deals with the electromangetic theory of the optical interactions in planar mul... more ABSTRACTThe paper deals with the electromangetic theory of the optical interactions in planar multilayer (ML) structures displaying magnetic order. The main attention is focussed on the practically important configuration of normal incidence and polar magnetization in an originally isotropic medium. The procedure providing the information on the ML optical response is treated in detail. It assumes that the thickness and optical parameters in each layer entering the ML structure allong with the azimuth and ellipticity of the incident wave are given as the input data. The optical response is given in terms of the complex amplitudes of the reflected and transmitted waves from which the ML optical parameters, i.e. “Kerr” and “Faraday” effects, transmission, reflectivity, quality factor, etc., can be derived. The experience has shown that the procedure gives plausible results even for ML structures consisting of the layers the thicknesses of which are in the nanometer range, i. e. in the...
Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005
A new null ellipsometer has been recently proposed that uses photoelastic modulator (PEM). The ph... more A new null ellipsometer has been recently proposed that uses photoelastic modulator (PEM). The phase modulation adds a good signal-to-noise ratio, high sensitivity, and linearity near null positions to the traditional high-precision nulling system. The ellipsometric angles Delta and psi are obtained by azimuth measurement of the analyzer and the polarizer--PEM system, for which the first and second harmonics of
Science and Technology of Advanced Materials, 2014