Son Le - Academia.edu (original) (raw)

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Papers by Son Le

Research paper thumbnail of Shot-Noise-Induced Failure in Nanoscale Flip-Flops Part II: Failure Rates in 10-nm Ultimate CMOS

IEEE Transactions on Electron Devices, 2000

... The authors are with the School of Engineering and the Depart-ment of Physics, Brown Universi... more ... The authors are with the School of Engineering and the Depart-ment of Physics, Brown University, Providence, RI 02912 USA (e-mail: Pooya@Brown.edu ... Fano factor of F < 1. However, since we have chosen a relatively low VDD, the Fano factor does not fall too far below unity ...

Research paper thumbnail of Shot-Noise-Induced Failure in Nanoscale Flip-Flops Part II: Failure Rates in 10-nm Ultimate CMOS

IEEE Transactions on Electron Devices, 2000

... The authors are with the School of Engineering and the Depart-ment of Physics, Brown Universi... more ... The authors are with the School of Engineering and the Depart-ment of Physics, Brown University, Providence, RI 02912 USA (e-mail: Pooya@Brown.edu ... Fano factor of F < 1. However, since we have chosen a relatively low VDD, the Fano factor does not fall too far below unity ...

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