Tetsuya Baba - Academia.edu (original) (raw)
Papers by Tetsuya Baba
Thermal Conductivity 20, 1989
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Proceedings of the 10th international conference on photoacoustic and photothermal phenomena, 1999
Thermal diffusivity of organic dye CV in powder form has been measured using PA effect. It is sho... more Thermal diffusivity of organic dye CV in powder form has been measured using PA effect. It is shown that this method permits to estimate the thermal diffusivity for transparent solvents using the dye at low concentration as a precursor.
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Key Engineering Materials, 2003
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Netsu Bussei, 1998
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Netsu Bussei, 1993
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Journal of the Vacuum Society of Japan, 2008
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Review of Scientific Instruments, 1985
Analysis of the operational error of heat flux transducers placed on wall Tetsuya Baba, Akira Ono... more Analysis of the operational error of heat flux transducers placed on wall Tetsuya Baba, Akira Ono, and Susumu Hattori National Research Laboratory of Metrology, Sakura-mura, Niihari-gun, Ibaraki 305, Japan (Received 8 August 1984; accepted for ... (А5) S t~Jo \Jo q where AT 0 ...
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Review of Scientific Instruments, 1986
beam profile measurement by a thermographic Tetsuya Baba, Temo Arai, and Akira Ono National Resea... more beam profile measurement by a thermographic Tetsuya Baba, Temo Arai, and Akira Ono National Research Laboratory of Metrology, Sakura-mura, Niihari-gun ... The receiving film was a stainless-steel foil both surfaces of which were coated by spraying with a black paint, dry ...
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High Temperatures - High Pressures, 2002
ABSTRACT A picosecond thermoreflectance measurement system in the National Research Laboratory of... more ABSTRACT A picosecond thermoreflectance measurement system in the National Research Laboratory of Metrology has been improved by introducing a 'rear heating/front probing' configuration. Both rear heating/front probing and conventional front heating/front probing thermoreflectance signals can be observed for thin films deposited on transparent substrates. The analytical solution of the temperature response is presented. It considers the penetration depth of a heating beam and a probe beam, and is derived based on the response function method. These analyses were applied to an aluminium thin film, nominally 100 nm thick, deposited on a Pyrex 7740 glass substrate. The thermal diffusivity calculated from the front heating/front probing thermoreflectance signal is 30% smaller than that of the bulk aluminium. The thermal diffusivity calculated from the rear heating/front probing thermoreflectance signal is 6.2% smaller than that of the bulk aluminium.
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International Journal of Thermophysics, 2002
ABSTRACT
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Review of Scientific Instruments, 2005
A new picosecond thermoreflectance measurement system using an electrical delay control has been ... more A new picosecond thermoreflectance measurement system using an electrical delay control has been developed in order to extend observation time of temperature response of thin films after pulse heating. The new system uses two picosecond titanium sapphire lasers, one for heating a specimen and the other for probing temperature change on the film surface. Temperature history of the film surface is observed by changing the delay time of the probe pulse from the pump pulse electrically instead of changing the difference of path length between the pump beam and the probe beam. It is not difficult to observe temperature history over longer time than the repetition period of the picosecond laser pulses using the electrical delay technique. The electrical delay technique can get rid of the fluctuation of focused position of the beam on the specimen surface which is hard to eliminate after traveling through the optical delay line of variable path length. Temperature history curves of sputtered tungsten thin films of 140, 200, and 300 nm thick on glass substrates have been observed much longer than the repetition period of picosecond laser pulses for the first time. An analytical model is proposed to explain temperature response after repetitive picosecond laser pulses considering heat diffusion across the thin film, heat diffusion parallel to the film face, and heat effusion into substrate. Based on this model, thermal diffusivity values of the tungsten thin films calculated from the observed temperature history curves are about 40% of that of bulk tungsten. This electrical delay technique can realize thermophysical property measurements of a wide variety of thin films such as thicker metal films, nonmetal thin films, low thermal diffusivity materials, and multilayered thin films, the heat diffusion time of which could not be covered by the optical delay technique.
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Thin Solid Films, 2010
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Review of Scientific Instruments, 2003
... Tetsuya Baba, Emmanuel Schaub, Akira Ono. Abstract. A new detection technique for picosecond ... more ... Tetsuya Baba, Emmanuel Schaub, Akira Ono. Abstract. A new detection technique for picosecond thermoreflectance measurements has been developed. Conventional picosecond thermoreflectance measurements detect the signal amplitude of a reflected probe laser beam ...
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Measurement Science and Technology, 2001
A picosecond thermoreflectance measurement system has been developed in the National Metrology In... more A picosecond thermoreflectance measurement system has been developed in the National Metrology Institute of Japan in order to measure thermal diffusivities of metal thin films. A laser beam from a picosecond Ti-sapphire laser is focused onto the surface of a metal thin film with a spot size of 100 µm and absorbed within the skin depth of the order of
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Measurement Science and Technology, 2001
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Measurement Science and Technology, 2001
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Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2005
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Thermal Conductivity 20, 1989
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Proceedings of the 10th international conference on photoacoustic and photothermal phenomena, 1999
Thermal diffusivity of organic dye CV in powder form has been measured using PA effect. It is sho... more Thermal diffusivity of organic dye CV in powder form has been measured using PA effect. It is shown that this method permits to estimate the thermal diffusivity for transparent solvents using the dye at low concentration as a precursor.
Bookmarks Related papers MentionsView impact
Key Engineering Materials, 2003
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Netsu Bussei, 1998
Bookmarks Related papers MentionsView impact
Netsu Bussei, 1993
Bookmarks Related papers MentionsView impact
Bookmarks Related papers MentionsView impact
Bookmarks Related papers MentionsView impact
Bookmarks Related papers MentionsView impact
Journal of the Vacuum Society of Japan, 2008
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Review of Scientific Instruments, 1985
Analysis of the operational error of heat flux transducers placed on wall Tetsuya Baba, Akira Ono... more Analysis of the operational error of heat flux transducers placed on wall Tetsuya Baba, Akira Ono, and Susumu Hattori National Research Laboratory of Metrology, Sakura-mura, Niihari-gun, Ibaraki 305, Japan (Received 8 August 1984; accepted for ... (А5) S t~Jo \Jo q where AT 0 ...
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Review of Scientific Instruments, 1986
beam profile measurement by a thermographic Tetsuya Baba, Temo Arai, and Akira Ono National Resea... more beam profile measurement by a thermographic Tetsuya Baba, Temo Arai, and Akira Ono National Research Laboratory of Metrology, Sakura-mura, Niihari-gun ... The receiving film was a stainless-steel foil both surfaces of which were coated by spraying with a black paint, dry ...
Bookmarks Related papers MentionsView impact
High Temperatures - High Pressures, 2002
ABSTRACT A picosecond thermoreflectance measurement system in the National Research Laboratory of... more ABSTRACT A picosecond thermoreflectance measurement system in the National Research Laboratory of Metrology has been improved by introducing a 'rear heating/front probing' configuration. Both rear heating/front probing and conventional front heating/front probing thermoreflectance signals can be observed for thin films deposited on transparent substrates. The analytical solution of the temperature response is presented. It considers the penetration depth of a heating beam and a probe beam, and is derived based on the response function method. These analyses were applied to an aluminium thin film, nominally 100 nm thick, deposited on a Pyrex 7740 glass substrate. The thermal diffusivity calculated from the front heating/front probing thermoreflectance signal is 30% smaller than that of the bulk aluminium. The thermal diffusivity calculated from the rear heating/front probing thermoreflectance signal is 6.2% smaller than that of the bulk aluminium.
Bookmarks Related papers MentionsView impact
International Journal of Thermophysics, 2002
ABSTRACT
Bookmarks Related papers MentionsView impact
Review of Scientific Instruments, 2005
A new picosecond thermoreflectance measurement system using an electrical delay control has been ... more A new picosecond thermoreflectance measurement system using an electrical delay control has been developed in order to extend observation time of temperature response of thin films after pulse heating. The new system uses two picosecond titanium sapphire lasers, one for heating a specimen and the other for probing temperature change on the film surface. Temperature history of the film surface is observed by changing the delay time of the probe pulse from the pump pulse electrically instead of changing the difference of path length between the pump beam and the probe beam. It is not difficult to observe temperature history over longer time than the repetition period of the picosecond laser pulses using the electrical delay technique. The electrical delay technique can get rid of the fluctuation of focused position of the beam on the specimen surface which is hard to eliminate after traveling through the optical delay line of variable path length. Temperature history curves of sputtered tungsten thin films of 140, 200, and 300 nm thick on glass substrates have been observed much longer than the repetition period of picosecond laser pulses for the first time. An analytical model is proposed to explain temperature response after repetitive picosecond laser pulses considering heat diffusion across the thin film, heat diffusion parallel to the film face, and heat effusion into substrate. Based on this model, thermal diffusivity values of the tungsten thin films calculated from the observed temperature history curves are about 40% of that of bulk tungsten. This electrical delay technique can realize thermophysical property measurements of a wide variety of thin films such as thicker metal films, nonmetal thin films, low thermal diffusivity materials, and multilayered thin films, the heat diffusion time of which could not be covered by the optical delay technique.
Bookmarks Related papers MentionsView impact
Thin Solid Films, 2010
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Review of Scientific Instruments, 2003
... Tetsuya Baba, Emmanuel Schaub, Akira Ono. Abstract. A new detection technique for picosecond ... more ... Tetsuya Baba, Emmanuel Schaub, Akira Ono. Abstract. A new detection technique for picosecond thermoreflectance measurements has been developed. Conventional picosecond thermoreflectance measurements detect the signal amplitude of a reflected probe laser beam ...
Bookmarks Related papers MentionsView impact
Measurement Science and Technology, 2001
A picosecond thermoreflectance measurement system has been developed in the National Metrology In... more A picosecond thermoreflectance measurement system has been developed in the National Metrology Institute of Japan in order to measure thermal diffusivities of metal thin films. A laser beam from a picosecond Ti-sapphire laser is focused onto the surface of a metal thin film with a spot size of 100 µm and absorbed within the skin depth of the order of
Bookmarks Related papers MentionsView impact
Measurement Science and Technology, 2001
Bookmarks Related papers MentionsView impact
Measurement Science and Technology, 2001
Bookmarks Related papers MentionsView impact
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2005
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