Y. Strzhemechny - Academia.edu (original) (raw)
Papers by Y. Strzhemechny
International Journal of Nanoscience, 2008
We report on the structure and morphology of thermoexfoliated graphite (TEG) powders and TEG-meta... more We report on the structure and morphology of thermoexfoliated graphite (TEG) powders and TEG-metal (Co, Cu, Ni) powders. Electrodynamic parameters of the compacted TEG and TEG-metal specimens have been studied along the compacting axis (c axis) within the range of electromagnetic radiation frequencies between 25.5 and 37.5 GHz. Metal particles attached to the surface of the TEG particles yield enhanced radiation shielding within the entire frequency range. Moreover, it is observed that the absorption coefficient increases with the increase in conductivity of the metal particles and is enhanced due to a high concentration of TEG-metal boundaries, which promote multiple reflections. Int. J. Nanosci. 2008.07:263-268. Downloaded from www.worldscientific.com by 91.202.128.0 on 03/28/13. For personal use only.
Low Temperature Physics, 2015
MRS Proceedings, 1999
We have successfully grafted polythiophene on polyethylene (PE) film with a three reactions step:... more We have successfully grafted polythiophene on polyethylene (PE) film with a three reactions step: gas phase bromination on PE, yielding PE-Br; substitution reaction of PE-Br with 2-thiophene thiolate anion, following by chemical oxidative polymerization. The polymerization was carried out in a suspension solution of anhydrous FeCI3 in CHCI 3 , yielding a reddish PE-PT film after dedoping with ethanol. ATR-FTIR shows that the polythiophene (PT) was grafted on PE in the 2,5-position; on the other hand, PT homopolymer shows a small amount of 2,4 coupling. XPS reveals higher intensity of the S2p, including neutral and positive sulfur. SEM image reveals the island of PT on the PE film. AFM analysis found the thickness of the island is in the range of 120-145 nm. The conductivity of these thin films is in the range of 10-6 S/cm.
Polymer International, 2003
Polythiophene (PT) was grafted on PE film using three reaction steps. First, PE films were bromin... more Polythiophene (PT) was grafted on PE film using three reaction steps. First, PE films were brominated in the gas phase, yielding PE-Br; second, a substitution reaction of PE-Br with 2-thiophene thiolate anion gave the thiophene-functionalized PE; finally PT was grafted on the PE surface using chemical oxidative polymerization to give PE-PT. The polymerization was carried out in a suspension solution of anhydrous FeCl 3 in CHCl 3 , yielding a reddish PE-PT film after dedoping with ethanol. ATR-FTIR shows that the PT was grafted on PE in the 2,5-position. SEM imaging revealed islands of PT on the PE film. AFM analysis found the thickness of islands to be in the range of 120-145 nm. The conductivity of these thin films was in the range of 10 À6 S cm À1 , a significant increase from the value of $10 À14 S cm À1 measured for PE film.
Polymer, 2001
Thin poly(styrene 210 -b-2-vinylpyridine 200 ) and poly(2-vinylpyridine 94 -b-styrene 760 -b-2-vi... more Thin poly(styrene 210 -b-2-vinylpyridine 200 ) and poly(2-vinylpyridine 94 -b-styrene 760 -b-2-vinylpyridine 94 ) films spun cast on silicon and annealed at 180ЊC for 3 days were directly cross sectioned in less than 1 h using the focused ion beam (FIB) lift-out technique. We show that with the FIB procedure, it is possible to produce cross sections that reveal structure near the silicon interface and hence the surface induced phase transitions could be examined and compared quantitatively with theoretical models. Atomic force microscopy, dynamic secondary ion mass spectrometry, and transmission electron microscopy were used to characterize the films. ᭧
Macromolecules, 1997
We have measured the Flory-Huggins interaction parameter ( ) for blends of polystyrene (PS) and p... more We have measured the Flory-Huggins interaction parameter ( ) for blends of polystyrene (PS) and poly(4-vinylpyridine) (P4VP) by three different methods. First, we measured the micelle spacings in microphase-separated films of PS-P4VP diblock copolymers by secondary ion mass spectrometry and atomic force microscopy. Second, we measured the contact angle of droplets of homopolymer PS on P4VP homopolymer film. Finally we determined the interfacial width between homopolymer layers of dPS and P4VP by neutron reflectometry. From each of these experiments was calculated using mean field theory in the strong segregation limit. These values of are much larger than those of other nonionic polymer pairs. We discuss the importance of this findings. † Present address:
Langmuir, 1998
Scanning transmission X-ray microscopy (STXM), atomic force microscopy (AFM), and dynamic seconda... more Scanning transmission X-ray microscopy (STXM), atomic force microscopy (AFM), and dynamic secondary ion mass spectrometry (DSIMS) were used to obtain the true three-dimensional concentration profiles of polystyrene (PS) and bromo-polystyrene (PBrx)0.79S where x ) fraction of monomers brominated) blend films as a function of PBrx)0.79S concentration. Upon annealing, it is found that the PBrS becomes encapsulated by the PS. The encapsulation provides for a continuous PS phase for all blend compositions and explains the observed structures that are formed for different PBrS volume fractions. The encapsulation allows us to estimate the dispersive contribution of the PBrS surface energy to be less than 20.6 dyn/cm. S0743-7463(98)00413-2 CCC: $15.00
Langmuir, 1999
Surface bromination of low-density polyethylene (LDPE) was carried out by brief exposure to gaseo... more Surface bromination of low-density polyethylene (LDPE) was carried out by brief exposure to gaseous bromine followed by UV irradiation. X-ray photoelectron spectroscopy suggests two different types of C-Br groups. Atomic force microscopy and wetting studies reveal that excessive bromination is accompanied by severe surface roughening. A nucleophilic substitution reaction was used to introduce surface 4-aminobenzenethiolate functionalities. UV spectral analysis indicates a grafting density of 2.9 bromine atoms per 100 Å 2 for the first bromination cycle.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1997
Secondary ion mass spectrometry ͑SIMS͒ is now routinely employed to obtain depth profiles in poly... more Secondary ion mass spectrometry ͑SIMS͒ is now routinely employed to obtain depth profiles in polymer films on silicon substrates, where diffusion, segregation, and ordering of deuterated polymer blend components are typically examined with a depth resolution of less than 100 Å. In some cases, diffusion or segregation behavior near the silicon surface is influenced by the extent of surface oxidation. There is also the potential for remnant moisture at the polymer/silicon interface to influence the redistribution of blend components. The effect of standard wet chemical wafer cleaning procedures on the polystyrene/silicon interface is investigated here. Deuterated solutions are employed to allow detection of remnant moisture from the cleaning/etching steps, and to indicate the extent of hydrogen termination at the polystyrene/silicon interface. Implant standards and deuterated polystyrene blends are employed to quantify the detected interfacial contaminants. The SIMS data indicate that the surface is effectively terminated by approximately one monolayer of hydrogen after an HF etch step, and by a thin oxide layer after an HCl/peroxide etch, in accord with numerous studies. There is no evidence of remnant moisture. Interfacial deuterium and oxygen are stable under 190°C anneals. The absence of CD Ϫ secondary ions at the interface indicates that the interfacial deuterium does not become associated with adjacent polystyrene chains. Low levels of fluorine are also monitored, and the integrated fluorine concentration at the polystyrene/silicon interface is less than 0.01 monolayers of coverage.
AIP Conference Proceedings, 2009
Size dependent melting behaviors of nanocrystalline in particles embedded in amorphous matrix J. ... more Size dependent melting behaviors of nanocrystalline in particles embedded in amorphous matrix J. Appl. Phys. 111, 043515 (2012) Stretch-induced plasmonic anisotropy of self-assembled gold nanoparticle mats Appl. Phys. Lett. 100, 073101 (2012) Perovskite phase transformation in 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 nanoparticles derived by sol-gel J. Appl. Phys. 111, 024314 (2012) Thermoelectric properties of Cu doped ZnSb containing Zn3P2 particles J. Appl. Phys. 111, 023703 (2012) Shock-induced consolidation and spallation of Cu nanopowders
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002
CuIn 1Ϫx Ga x Se 2 ͑CIGS͒ is a leading candidate for high-efficiency solar cells, yet the defects... more CuIn 1Ϫx Ga x Se 2 ͑CIGS͒ is a leading candidate for high-efficiency solar cells, yet the defects and electronic structure that define performance are relatively unexplored. We employed low-energy depth-resolved cathodoluminescence to measure the local band and defect properties of epitaxial CIGS films having ͑002͒, ͑220͒/͑204͒, or ͑112͒ orientations on GaAs substrates. Along with a near-band-edge emission, room-temperature luminescence spectra for all epitaxial samples reveal a well-defined deep-level transition confined within ϳ100 nm of the surface. The intensity of this defect-related feature reaches a maximum at the surface relative to the near-band-edge peak. Polycrystalline CdS/CIGS/Mo/glass and CIGS/Mo/glass solar-cell layers were also studied. These exhibit a weaker deep-level emission modulated by CIGS-thickness-related optical cavity effects. The integrated intensity of this emission relative to the near-band-edge peak intensity is also a maximum at the surface and decreases into the sample. A strong deep-level emission due to CdS was also observed decaying with depth relative to the near-band-edge emission of the CIGS. The CdS emission was the only significant change in the polycrystalline emission spectrum with and without the CdS layer. The observed behavior is consistent with the existence of a nanoscale near-surface defective region whose properties can impact charge generation and recombination in solar energy-generating structures.
Superlattices and Microstructures, 2005
Conduction processes in as-grown and annealed n-type ZnO crystals have been studied by means of H... more Conduction processes in as-grown and annealed n-type ZnO crystals have been studied by means of Hall-effect measurements and X-ray photoelectron spectroscopy (XPS). For temperatures above approximately 50 K, the conductance is dominated by electrons in the bulk of the crystal, whereas below that temperature, surface conductance becomes more important. As the crystals are annealed in flowing N 2 gas, the surface sheet carrier concentration increases, and concomitantly, the OH-bond peak in the XPS spectrum becomes a larger fraction of the total O peak. Conversely, either O 2 -plasma annealing or electron-beam irradiation produces a decrease in the surface conductance and the OH fraction. Thus, H-related donors are likely the cause of the surface conductance.
Journal of Nanomaterials - J NANOMATER, 2007
We report on the results of numerical simulations for the linear optical polarizability of single... more We report on the results of numerical simulations for the linear optical polarizability of single-walled zigzag (9, 0) carbon nanotubes with modified ends. The nanotubes of a variable length are fullerene-capped at one end and covalently bonded to a hydrophobic cluster of nine benzene rings at the other end. We investigate electronic and optical properties of such structures within a framework of the Su-Schrieffer-Heeger model. We demonstrated that the localized states in this system exhibit nonlinear characteristics of excited states. The nanotubes have a strongly oscillating dependence of their optical polarizability on the energy of incident light. Spectral features of the optical polarizability drop in intensity and shift towards higher energies with a decrease in the length of a nanotube or upon fullerene-uncapping. The length dependence is similar for the nanotubes without benzene rings, capped either at one or both ends. Potential applications are suggested for hydrophobic pollutant control in liquid-purification systems.
Modern Physics Letters B, 2008
We report on our recent electron-tunneling studies of bulk manganite samples that provide importa... more We report on our recent electron-tunneling studies of bulk manganite samples that provide important information about the structure of the near-surface layers of the material and the nature of the charge transport across them. It is shown that the even part of the differential conductance of contacts formed by a metallic injector with the surface of a manganite is a power function of the voltage bias. High voltages applied to the sample are found to locally modify the conductance of the degraded native surface layer. Experiments aimed to monitor the force applied to a metal tip pressed into the surface of a manganite prove the presence of sub-surface layers with properties significantly different from those near the surface. Experimental data are analyzed and interpreted within the Glazman-Matveev theory taking into account inelastic tunneling through two metallic "drops" inside the insulating barrier.
Modelling and Simulation in Materials Science and Engineering, 2008
An engineering micromechanical model for carbon/carbon composites with a pyrocarbon (PC) matrix i... more An engineering micromechanical model for carbon/carbon composites with a pyrocarbon (PC) matrix is presented. The model of the matrix plays an essential role in modelling of the material. This model takes into account the structural heterogeneity of the PC matrix and the anisotropy of the carbon fibres. The PC matrix is considered as a polycrystalline aggregate of anisotropic PC grains (or crystallites) with random shapes and orientations. The carbon fibres are homogeneous and anisotropic. The mathematical foundation for the model is a homogenization procedure for a multicomponent heterogeneous medium with a stochastic structure, anisotropic components and variable volume fractions of the components. The stochastic structure of the matrix generates fields of fluctuating microstresses and stochastic fractures of individual PC grains. Due to the anisotropy, the PC grains can fracture or become partially damaged via several fracture modes with different probabilities depending on the macrostress state of the material. The model allows calculation of the full stress-strain diagram for the carbon/carbon composite with arbitrary multiaxial loads and to forecast the appropriate strength limits. As an application of the model, numerical results are presented for a three-point bending of a short beam made of unidirectional materials. The calculated interlaminar shear strength matches the available experimental data.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2006
We report on the microscopic characteristics of polycrystalline CuIn 1−x Ga x Se 2 thin films pro... more We report on the microscopic characteristics of polycrystalline CuIn 1−x Ga x Se 2 thin films probed with Auger electron spectroscopy, cathodoluminescence spectroscopy, secondary ion mass spectrometry, and work function measurements. Confirming theory, we find a substantial reduction in Cu content from grain interior to boundary and a p-type potential barrier that acts to reduce hole recombination. Such compositional and electrostatic variations between grain boundaries and grain interiors in CuIn 1−x Ga x Se 2 solar cell absorber layers may improve the overall photovoltaic efficiency. The high degree of intergranular inhomogeneity emphasizes the importance of detailed grain-by-grain analysis. These results show that careful specimen preparation and ultrahigh vacuum conditions, coupled with nanoscale instrumental resolution, are pivotal for such analysis.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2006
Current understanding and control of semiconductor contacts increasingly require measurements sen... more Current understanding and control of semiconductor contacts increasingly require measurements sensitive to defects and chemical changes at nanoscale interfaces. We offer examples illustrating dramatic macroscopic effects occurring in semiconductor systems as a result of nanoscale interface phenomena. In some cases, there is interplay of several competing defect-driven mechanisms. Elucidating them and finding the leading ones require careful experimental approach. For single-crystalline ZnO, we study the role of near-surface defects on the formation of Au Schottky contacts. Among the factors degrading the rectifying characteristics of such contacts one should consider the following. High concentrations of shallow donors in the surface and subsurface regions lead to barrier thinning, resulting in increased tunneling. Alternatively, the presence of deep defects near contact interface promotes tunneling by defect-assisted hopping. Nanoscale electronic and chemical studies show that independent reduction of both shallow donors and deep defects significantly improves the rectifying performance of the Au/ ZnO contacts. We find that processing of ZnO with remote O and H plasmas allows for controllable tailoring of chemical and physical properties of the surface. By the same token, nanoscale compositional and electrostatic variations between grain boundaries and grain interiors in thin polycrystalline films of Cu͑In, Ga͒Se 2 , absorber layers in record-setting solar cells, show how nanoscale arrangement of near-surface stoichiometric defects may improve the overall photovoltaic efficiency. Confirming the theory, we find a 50% reduction in Cu composition from grain interior to boundary and a p-type potential barrier that acts to reduce majority-carrier hole recombination. These examples emphasize the practical significance of nanoscale chemical and electronic features at electronic material interfaces.
International Journal of Nanoscience, 2008
We report on the structure and morphology of thermoexfoliated graphite (TEG) powders and TEG-meta... more We report on the structure and morphology of thermoexfoliated graphite (TEG) powders and TEG-metal (Co, Cu, Ni) powders. Electrodynamic parameters of the compacted TEG and TEG-metal specimens have been studied along the compacting axis (c axis) within the range of electromagnetic radiation frequencies between 25.5 and 37.5 GHz. Metal particles attached to the surface of the TEG particles yield enhanced radiation shielding within the entire frequency range. Moreover, it is observed that the absorption coefficient increases with the increase in conductivity of the metal particles and is enhanced due to a high concentration of TEG-metal boundaries, which promote multiple reflections. Int. J. Nanosci. 2008.07:263-268. Downloaded from www.worldscientific.com by 91.202.128.0 on 03/28/13. For personal use only.
Low Temperature Physics, 2015
MRS Proceedings, 1999
We have successfully grafted polythiophene on polyethylene (PE) film with a three reactions step:... more We have successfully grafted polythiophene on polyethylene (PE) film with a three reactions step: gas phase bromination on PE, yielding PE-Br; substitution reaction of PE-Br with 2-thiophene thiolate anion, following by chemical oxidative polymerization. The polymerization was carried out in a suspension solution of anhydrous FeCI3 in CHCI 3 , yielding a reddish PE-PT film after dedoping with ethanol. ATR-FTIR shows that the polythiophene (PT) was grafted on PE in the 2,5-position; on the other hand, PT homopolymer shows a small amount of 2,4 coupling. XPS reveals higher intensity of the S2p, including neutral and positive sulfur. SEM image reveals the island of PT on the PE film. AFM analysis found the thickness of the island is in the range of 120-145 nm. The conductivity of these thin films is in the range of 10-6 S/cm.
Polymer International, 2003
Polythiophene (PT) was grafted on PE film using three reaction steps. First, PE films were bromin... more Polythiophene (PT) was grafted on PE film using three reaction steps. First, PE films were brominated in the gas phase, yielding PE-Br; second, a substitution reaction of PE-Br with 2-thiophene thiolate anion gave the thiophene-functionalized PE; finally PT was grafted on the PE surface using chemical oxidative polymerization to give PE-PT. The polymerization was carried out in a suspension solution of anhydrous FeCl 3 in CHCl 3 , yielding a reddish PE-PT film after dedoping with ethanol. ATR-FTIR shows that the PT was grafted on PE in the 2,5-position. SEM imaging revealed islands of PT on the PE film. AFM analysis found the thickness of islands to be in the range of 120-145 nm. The conductivity of these thin films was in the range of 10 À6 S cm À1 , a significant increase from the value of $10 À14 S cm À1 measured for PE film.
Polymer, 2001
Thin poly(styrene 210 -b-2-vinylpyridine 200 ) and poly(2-vinylpyridine 94 -b-styrene 760 -b-2-vi... more Thin poly(styrene 210 -b-2-vinylpyridine 200 ) and poly(2-vinylpyridine 94 -b-styrene 760 -b-2-vinylpyridine 94 ) films spun cast on silicon and annealed at 180ЊC for 3 days were directly cross sectioned in less than 1 h using the focused ion beam (FIB) lift-out technique. We show that with the FIB procedure, it is possible to produce cross sections that reveal structure near the silicon interface and hence the surface induced phase transitions could be examined and compared quantitatively with theoretical models. Atomic force microscopy, dynamic secondary ion mass spectrometry, and transmission electron microscopy were used to characterize the films. ᭧
Macromolecules, 1997
We have measured the Flory-Huggins interaction parameter ( ) for blends of polystyrene (PS) and p... more We have measured the Flory-Huggins interaction parameter ( ) for blends of polystyrene (PS) and poly(4-vinylpyridine) (P4VP) by three different methods. First, we measured the micelle spacings in microphase-separated films of PS-P4VP diblock copolymers by secondary ion mass spectrometry and atomic force microscopy. Second, we measured the contact angle of droplets of homopolymer PS on P4VP homopolymer film. Finally we determined the interfacial width between homopolymer layers of dPS and P4VP by neutron reflectometry. From each of these experiments was calculated using mean field theory in the strong segregation limit. These values of are much larger than those of other nonionic polymer pairs. We discuss the importance of this findings. † Present address:
Langmuir, 1998
Scanning transmission X-ray microscopy (STXM), atomic force microscopy (AFM), and dynamic seconda... more Scanning transmission X-ray microscopy (STXM), atomic force microscopy (AFM), and dynamic secondary ion mass spectrometry (DSIMS) were used to obtain the true three-dimensional concentration profiles of polystyrene (PS) and bromo-polystyrene (PBrx)0.79S where x ) fraction of monomers brominated) blend films as a function of PBrx)0.79S concentration. Upon annealing, it is found that the PBrS becomes encapsulated by the PS. The encapsulation provides for a continuous PS phase for all blend compositions and explains the observed structures that are formed for different PBrS volume fractions. The encapsulation allows us to estimate the dispersive contribution of the PBrS surface energy to be less than 20.6 dyn/cm. S0743-7463(98)00413-2 CCC: $15.00
Langmuir, 1999
Surface bromination of low-density polyethylene (LDPE) was carried out by brief exposure to gaseo... more Surface bromination of low-density polyethylene (LDPE) was carried out by brief exposure to gaseous bromine followed by UV irradiation. X-ray photoelectron spectroscopy suggests two different types of C-Br groups. Atomic force microscopy and wetting studies reveal that excessive bromination is accompanied by severe surface roughening. A nucleophilic substitution reaction was used to introduce surface 4-aminobenzenethiolate functionalities. UV spectral analysis indicates a grafting density of 2.9 bromine atoms per 100 Å 2 for the first bromination cycle.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1997
Secondary ion mass spectrometry ͑SIMS͒ is now routinely employed to obtain depth profiles in poly... more Secondary ion mass spectrometry ͑SIMS͒ is now routinely employed to obtain depth profiles in polymer films on silicon substrates, where diffusion, segregation, and ordering of deuterated polymer blend components are typically examined with a depth resolution of less than 100 Å. In some cases, diffusion or segregation behavior near the silicon surface is influenced by the extent of surface oxidation. There is also the potential for remnant moisture at the polymer/silicon interface to influence the redistribution of blend components. The effect of standard wet chemical wafer cleaning procedures on the polystyrene/silicon interface is investigated here. Deuterated solutions are employed to allow detection of remnant moisture from the cleaning/etching steps, and to indicate the extent of hydrogen termination at the polystyrene/silicon interface. Implant standards and deuterated polystyrene blends are employed to quantify the detected interfacial contaminants. The SIMS data indicate that the surface is effectively terminated by approximately one monolayer of hydrogen after an HF etch step, and by a thin oxide layer after an HCl/peroxide etch, in accord with numerous studies. There is no evidence of remnant moisture. Interfacial deuterium and oxygen are stable under 190°C anneals. The absence of CD Ϫ secondary ions at the interface indicates that the interfacial deuterium does not become associated with adjacent polystyrene chains. Low levels of fluorine are also monitored, and the integrated fluorine concentration at the polystyrene/silicon interface is less than 0.01 monolayers of coverage.
AIP Conference Proceedings, 2009
Size dependent melting behaviors of nanocrystalline in particles embedded in amorphous matrix J. ... more Size dependent melting behaviors of nanocrystalline in particles embedded in amorphous matrix J. Appl. Phys. 111, 043515 (2012) Stretch-induced plasmonic anisotropy of self-assembled gold nanoparticle mats Appl. Phys. Lett. 100, 073101 (2012) Perovskite phase transformation in 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 nanoparticles derived by sol-gel J. Appl. Phys. 111, 024314 (2012) Thermoelectric properties of Cu doped ZnSb containing Zn3P2 particles J. Appl. Phys. 111, 023703 (2012) Shock-induced consolidation and spallation of Cu nanopowders
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2002
CuIn 1Ϫx Ga x Se 2 ͑CIGS͒ is a leading candidate for high-efficiency solar cells, yet the defects... more CuIn 1Ϫx Ga x Se 2 ͑CIGS͒ is a leading candidate for high-efficiency solar cells, yet the defects and electronic structure that define performance are relatively unexplored. We employed low-energy depth-resolved cathodoluminescence to measure the local band and defect properties of epitaxial CIGS films having ͑002͒, ͑220͒/͑204͒, or ͑112͒ orientations on GaAs substrates. Along with a near-band-edge emission, room-temperature luminescence spectra for all epitaxial samples reveal a well-defined deep-level transition confined within ϳ100 nm of the surface. The intensity of this defect-related feature reaches a maximum at the surface relative to the near-band-edge peak. Polycrystalline CdS/CIGS/Mo/glass and CIGS/Mo/glass solar-cell layers were also studied. These exhibit a weaker deep-level emission modulated by CIGS-thickness-related optical cavity effects. The integrated intensity of this emission relative to the near-band-edge peak intensity is also a maximum at the surface and decreases into the sample. A strong deep-level emission due to CdS was also observed decaying with depth relative to the near-band-edge emission of the CIGS. The CdS emission was the only significant change in the polycrystalline emission spectrum with and without the CdS layer. The observed behavior is consistent with the existence of a nanoscale near-surface defective region whose properties can impact charge generation and recombination in solar energy-generating structures.
Superlattices and Microstructures, 2005
Conduction processes in as-grown and annealed n-type ZnO crystals have been studied by means of H... more Conduction processes in as-grown and annealed n-type ZnO crystals have been studied by means of Hall-effect measurements and X-ray photoelectron spectroscopy (XPS). For temperatures above approximately 50 K, the conductance is dominated by electrons in the bulk of the crystal, whereas below that temperature, surface conductance becomes more important. As the crystals are annealed in flowing N 2 gas, the surface sheet carrier concentration increases, and concomitantly, the OH-bond peak in the XPS spectrum becomes a larger fraction of the total O peak. Conversely, either O 2 -plasma annealing or electron-beam irradiation produces a decrease in the surface conductance and the OH fraction. Thus, H-related donors are likely the cause of the surface conductance.
Journal of Nanomaterials - J NANOMATER, 2007
We report on the results of numerical simulations for the linear optical polarizability of single... more We report on the results of numerical simulations for the linear optical polarizability of single-walled zigzag (9, 0) carbon nanotubes with modified ends. The nanotubes of a variable length are fullerene-capped at one end and covalently bonded to a hydrophobic cluster of nine benzene rings at the other end. We investigate electronic and optical properties of such structures within a framework of the Su-Schrieffer-Heeger model. We demonstrated that the localized states in this system exhibit nonlinear characteristics of excited states. The nanotubes have a strongly oscillating dependence of their optical polarizability on the energy of incident light. Spectral features of the optical polarizability drop in intensity and shift towards higher energies with a decrease in the length of a nanotube or upon fullerene-uncapping. The length dependence is similar for the nanotubes without benzene rings, capped either at one or both ends. Potential applications are suggested for hydrophobic pollutant control in liquid-purification systems.
Modern Physics Letters B, 2008
We report on our recent electron-tunneling studies of bulk manganite samples that provide importa... more We report on our recent electron-tunneling studies of bulk manganite samples that provide important information about the structure of the near-surface layers of the material and the nature of the charge transport across them. It is shown that the even part of the differential conductance of contacts formed by a metallic injector with the surface of a manganite is a power function of the voltage bias. High voltages applied to the sample are found to locally modify the conductance of the degraded native surface layer. Experiments aimed to monitor the force applied to a metal tip pressed into the surface of a manganite prove the presence of sub-surface layers with properties significantly different from those near the surface. Experimental data are analyzed and interpreted within the Glazman-Matveev theory taking into account inelastic tunneling through two metallic "drops" inside the insulating barrier.
Modelling and Simulation in Materials Science and Engineering, 2008
An engineering micromechanical model for carbon/carbon composites with a pyrocarbon (PC) matrix i... more An engineering micromechanical model for carbon/carbon composites with a pyrocarbon (PC) matrix is presented. The model of the matrix plays an essential role in modelling of the material. This model takes into account the structural heterogeneity of the PC matrix and the anisotropy of the carbon fibres. The PC matrix is considered as a polycrystalline aggregate of anisotropic PC grains (or crystallites) with random shapes and orientations. The carbon fibres are homogeneous and anisotropic. The mathematical foundation for the model is a homogenization procedure for a multicomponent heterogeneous medium with a stochastic structure, anisotropic components and variable volume fractions of the components. The stochastic structure of the matrix generates fields of fluctuating microstresses and stochastic fractures of individual PC grains. Due to the anisotropy, the PC grains can fracture or become partially damaged via several fracture modes with different probabilities depending on the macrostress state of the material. The model allows calculation of the full stress-strain diagram for the carbon/carbon composite with arbitrary multiaxial loads and to forecast the appropriate strength limits. As an application of the model, numerical results are presented for a three-point bending of a short beam made of unidirectional materials. The calculated interlaminar shear strength matches the available experimental data.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2006
We report on the microscopic characteristics of polycrystalline CuIn 1−x Ga x Se 2 thin films pro... more We report on the microscopic characteristics of polycrystalline CuIn 1−x Ga x Se 2 thin films probed with Auger electron spectroscopy, cathodoluminescence spectroscopy, secondary ion mass spectrometry, and work function measurements. Confirming theory, we find a substantial reduction in Cu content from grain interior to boundary and a p-type potential barrier that acts to reduce hole recombination. Such compositional and electrostatic variations between grain boundaries and grain interiors in CuIn 1−x Ga x Se 2 solar cell absorber layers may improve the overall photovoltaic efficiency. The high degree of intergranular inhomogeneity emphasizes the importance of detailed grain-by-grain analysis. These results show that careful specimen preparation and ultrahigh vacuum conditions, coupled with nanoscale instrumental resolution, are pivotal for such analysis.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 2006
Current understanding and control of semiconductor contacts increasingly require measurements sen... more Current understanding and control of semiconductor contacts increasingly require measurements sensitive to defects and chemical changes at nanoscale interfaces. We offer examples illustrating dramatic macroscopic effects occurring in semiconductor systems as a result of nanoscale interface phenomena. In some cases, there is interplay of several competing defect-driven mechanisms. Elucidating them and finding the leading ones require careful experimental approach. For single-crystalline ZnO, we study the role of near-surface defects on the formation of Au Schottky contacts. Among the factors degrading the rectifying characteristics of such contacts one should consider the following. High concentrations of shallow donors in the surface and subsurface regions lead to barrier thinning, resulting in increased tunneling. Alternatively, the presence of deep defects near contact interface promotes tunneling by defect-assisted hopping. Nanoscale electronic and chemical studies show that independent reduction of both shallow donors and deep defects significantly improves the rectifying performance of the Au/ ZnO contacts. We find that processing of ZnO with remote O and H plasmas allows for controllable tailoring of chemical and physical properties of the surface. By the same token, nanoscale compositional and electrostatic variations between grain boundaries and grain interiors in thin polycrystalline films of Cu͑In, Ga͒Se 2 , absorber layers in record-setting solar cells, show how nanoscale arrangement of near-surface stoichiometric defects may improve the overall photovoltaic efficiency. Confirming the theory, we find a 50% reduction in Cu composition from grain interior to boundary and a p-type potential barrier that acts to reduce majority-carrier hole recombination. These examples emphasize the practical significance of nanoscale chemical and electronic features at electronic material interfaces.