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Papers by Yannick Deshayes

Research paper thumbnail of Caractérisation des imageurs OLEDs pour des applications aéronautiques

HAL (Le Centre pour la Communication Scientifique Directe), Sep 1, 2011

Research paper thumbnail of Spatial distribution of Pr3+ and ions in Ca1-xPrxF2+x luminescent thin films

HAL (Le Centre pour la Communication Scientifique Directe), 1999

Research paper thumbnail of Archivage numérique pérenne - Les nouvelles solutions de stockage sur disques en verre

HAL (Le Centre pour la Communication Scientifique Directe), Sep 1, 2013

Research paper thumbnail of Les LEDS, un défi technologique permanen

HAL (Le Centre pour la Communication Scientifique Directe), Oct 10, 2015

Research paper thumbnail of Quelques solutions alternatives et leur évaluation

HAL (Le Centre pour la Communication Scientifique Directe), Feb 1, 2011

Research paper thumbnail of Le projet Archive & Forget

HAL (Le Centre pour la Communication Scientifique Directe), Mar 1, 2012

Research paper thumbnail of Optoélectronique appliquée : mesures, instrumentation et modèles électro-optiques : diodes électroluminescentes

HAL (Le Centre pour la Communication Scientifique Directe), 2014

Research paper thumbnail of Chapter 7 : Laser Welding : characteristics and FEM simulations

Research paper thumbnail of Impact of radiation effects on AlGaAs/GaAs, InGaN/GaN and AlGaInP/GaP packaged light emitting diodes for space applications

Research paper thumbnail of Long-term reliability prediction of 935 nm InGaAs/GaAs Light Emitting Diodes using degradation laws and ageing tests with low acceleration factor

HAL (Le Centre pour la Communication Scientifique Directe), 2005

Research paper thumbnail of Archivage numérique pérenne - Projet archive & Forget

Research paper thumbnail of Les LEDs : un défi technologique permanent

Les diodes electroluminescentes (LED), et en particulier celles developpees dans les annees 90 qu... more Les diodes electroluminescentes (LED), et en particulier celles developpees dans les annees 90 qui emettent dans le bleu, viennent d'etre recompensees par le prix Nobel de physique 2014. Les applications a base de LED sont aujourd’hui, nombreuses : TVLED, ecran d’ordinateur, eclairage automobile, eclairage interieur et exterieur. Cette formidable avancee technologique necessite encore des ameliorations en terme de management thermique, d’adaptation aux usages et de cout. Apres un historique sur les differentes sources de lumiere, nous dresserons un tableau des technologies actuellement mise sur le marche. Nous donnerons quelques elements pour comprendre le fonctionnement de l’eclairage a LED et termineront, nous donnerons par les technologies en phase de developpement.

Research paper thumbnail of Thermomechanical Stresses and Optical Misalignment in 1550 nm Emissive Optoelectronic Modules Using FEM and Process Dispersions

HAL (Le Centre pour la Communication Scientifique Directe), 2008

Research paper thumbnail of Thermal characteristics measurement of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties

HAL (Le Centre pour la Communication Scientifique Directe), Jun 1, 2008

Research paper thumbnail of Etude de la faisabilité d’inscription de donnée numérique en surface par Laser femtoseconde

HAL (Le Centre pour la Communication Scientifique Directe), Jul 1, 2013

Research paper thumbnail of Lifetime distribution estimation of Light emitting diode

HAL (Le Centre pour la Communication Scientifique Directe), May 11, 2009

Research paper thumbnail of Etude thermomécanique des têtes optiques LMI 1550 nm – Evaluation technologique

HAL (Le Centre pour la Communication Scientifique Directe), Mar 1, 2001

Research paper thumbnail of Direct Laser-writing in photosensitive glasses: Correlative microscopy of fluorescent silver aggregates and the associated space charge separation

HAL (Le Centre pour la Communication Scientifique Directe), Jun 1, 2012

Research paper thumbnail of Simulations of thermomechanical stresses and optical misalignment in 1.55 µm emissive optoelectronic modules using FEM and process dispersions

HAL (Le Centre pour la Communication Scientifique Directe), 2004

ABSTRACT Expertise of packaging for optoelectronic components requires the solution of optical, m... more ABSTRACT Expertise of packaging for optoelectronic components requires the solution of optical, mechanical, and electrical problems in the same way. The purpose of this paper is to present three-dimensional simulations using finite-element method (FEM) of thermomechanical stresses and strains in 1550-nm laser modules induced by Nd:YAG crystal laser welds and thermal cycles on main subassembly laser submount. Nonlinear FEM computations, taking into account of experimental sigma(epsiv) measured curves, show that the laser welding process can induce high level of strains in columns of the laser platform, bearing the laser diode, responsible of an optical axis shift and a gradual drop of the optical power in relation with relaxation of accumulated stresses in the subassembly (W. M. Sherry et al., ldquoHigh performance optoelectronic packaging for 2.5 and 10 Gb/s laser modules,rdquo in Proc. Electron. Compon. Technol. Conf., 1996, pp. 620-627). Typical stresses are close to 160 MPa with drift about 5 MPa with the dispersion of energy level of the laser Nd: YAG beam. The introduction of both material and process dispersion in order to evaluate their impact on product lifetime distribution has been taking into account. In the case of thermal cycles, stresses can occur on elements sensitive to coefficient of thermal expansion mismatches such as solder joints between the laser platform and thermoelectric cooler and as fiber glued into the pigtail leading to crack propagation with sudden drop of optical power. A previous paper demonstrated that laser submount is the most sensitive part of optical system (Deshayes, et al., ldquoThree-dimensional FEM simulations of thermal mechanical stresses in 1.55 mum laser modules,rdquo Microelectron. Rel., vol. 43, no. 7, pp. 1125 -1136, Jul. 2003). Experimental analyses were also conducted to correlate simulation results and monitor the output optical power of laser modules after 500 thermal cycles ( -40degC/ + 85degC VRT).

Research paper thumbnail of Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations

HAL (Le Centre pour la Communication Scientifique Directe), 2004

ABSTRACT High performance and high reliability are two of the most important goals driving the pe... more ABSTRACT High performance and high reliability are two of the most important goals driving the penetration of optical transmission into telecommunication systems ranging from 880 nm to 1550 nm. Lifetime prediction defined as the time at which a parameter reaches its maximum acceptable shirt still stays the main result in terms of reliability estimation for a technology. For optoelectronic emissive components, selection tests and life testing are specifically used for reliability evaluation according to Telcordia GR-468 CORE requirements. This approach is based on extrapolation of degradation laws, based on physics of failure and electrical or optical parameters, allowing both strong test time reduction and long-term reliability prediction. Unfortunately, in the case of mature technology, there is a growing complexity to calculate average lifetime and failure rates (FITs) using ageing tests in particular due to extremely low failure rates. For present laser diode technologies, time to failure tend to be 106 hours aged under typical conditions (Popt=10 mW and T=80°C). These ageing tests must be performed on more than 100 components aged during 10000 hours mixing different temperatures and drive current conditions conducting to acceleration factors above 300-400. These conditions are high-cost, time consuming and cannot give a complete distribution of times to failure. A new approach consists in use statistic computations to extrapolate lifetime distribution and failure rates in operating conditions from physical parameters of experimental degradation laws. In this paper, Distributed Feedback single mode laser diodes (DFB-LD) used for 1550 nm telecommunication network working at 2.5 Gbit/s transfer rate are studied. Electrical and optical parameters have been measured before and after ageing tests, performed at constant current, according to Telcordia GR-468 requirements. Cumulative failure rates and lifetime distributions are computed using statistic calculations and equations of drift mechanisms versus time fitted from experimental measurements.

Research paper thumbnail of Caractérisation des imageurs OLEDs pour des applications aéronautiques

HAL (Le Centre pour la Communication Scientifique Directe), Sep 1, 2011

Research paper thumbnail of Spatial distribution of Pr3+ and ions in Ca1-xPrxF2+x luminescent thin films

HAL (Le Centre pour la Communication Scientifique Directe), 1999

Research paper thumbnail of Archivage numérique pérenne - Les nouvelles solutions de stockage sur disques en verre

HAL (Le Centre pour la Communication Scientifique Directe), Sep 1, 2013

Research paper thumbnail of Les LEDS, un défi technologique permanen

HAL (Le Centre pour la Communication Scientifique Directe), Oct 10, 2015

Research paper thumbnail of Quelques solutions alternatives et leur évaluation

HAL (Le Centre pour la Communication Scientifique Directe), Feb 1, 2011

Research paper thumbnail of Le projet Archive & Forget

HAL (Le Centre pour la Communication Scientifique Directe), Mar 1, 2012

Research paper thumbnail of Optoélectronique appliquée : mesures, instrumentation et modèles électro-optiques : diodes électroluminescentes

HAL (Le Centre pour la Communication Scientifique Directe), 2014

Research paper thumbnail of Chapter 7 : Laser Welding : characteristics and FEM simulations

Research paper thumbnail of Impact of radiation effects on AlGaAs/GaAs, InGaN/GaN and AlGaInP/GaP packaged light emitting diodes for space applications

Research paper thumbnail of Long-term reliability prediction of 935 nm InGaAs/GaAs Light Emitting Diodes using degradation laws and ageing tests with low acceleration factor

HAL (Le Centre pour la Communication Scientifique Directe), 2005

Research paper thumbnail of Archivage numérique pérenne - Projet archive & Forget

Research paper thumbnail of Les LEDs : un défi technologique permanent

Les diodes electroluminescentes (LED), et en particulier celles developpees dans les annees 90 qu... more Les diodes electroluminescentes (LED), et en particulier celles developpees dans les annees 90 qui emettent dans le bleu, viennent d'etre recompensees par le prix Nobel de physique 2014. Les applications a base de LED sont aujourd’hui, nombreuses : TVLED, ecran d’ordinateur, eclairage automobile, eclairage interieur et exterieur. Cette formidable avancee technologique necessite encore des ameliorations en terme de management thermique, d’adaptation aux usages et de cout. Apres un historique sur les differentes sources de lumiere, nous dresserons un tableau des technologies actuellement mise sur le marche. Nous donnerons quelques elements pour comprendre le fonctionnement de l’eclairage a LED et termineront, nous donnerons par les technologies en phase de developpement.

Research paper thumbnail of Thermomechanical Stresses and Optical Misalignment in 1550 nm Emissive Optoelectronic Modules Using FEM and Process Dispersions

HAL (Le Centre pour la Communication Scientifique Directe), 2008

Research paper thumbnail of Thermal characteristics measurement of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties

HAL (Le Centre pour la Communication Scientifique Directe), Jun 1, 2008

Research paper thumbnail of Etude de la faisabilité d’inscription de donnée numérique en surface par Laser femtoseconde

HAL (Le Centre pour la Communication Scientifique Directe), Jul 1, 2013

Research paper thumbnail of Lifetime distribution estimation of Light emitting diode

HAL (Le Centre pour la Communication Scientifique Directe), May 11, 2009

Research paper thumbnail of Etude thermomécanique des têtes optiques LMI 1550 nm – Evaluation technologique

HAL (Le Centre pour la Communication Scientifique Directe), Mar 1, 2001

Research paper thumbnail of Direct Laser-writing in photosensitive glasses: Correlative microscopy of fluorescent silver aggregates and the associated space charge separation

HAL (Le Centre pour la Communication Scientifique Directe), Jun 1, 2012

Research paper thumbnail of Simulations of thermomechanical stresses and optical misalignment in 1.55 µm emissive optoelectronic modules using FEM and process dispersions

HAL (Le Centre pour la Communication Scientifique Directe), 2004

ABSTRACT Expertise of packaging for optoelectronic components requires the solution of optical, m... more ABSTRACT Expertise of packaging for optoelectronic components requires the solution of optical, mechanical, and electrical problems in the same way. The purpose of this paper is to present three-dimensional simulations using finite-element method (FEM) of thermomechanical stresses and strains in 1550-nm laser modules induced by Nd:YAG crystal laser welds and thermal cycles on main subassembly laser submount. Nonlinear FEM computations, taking into account of experimental sigma(epsiv) measured curves, show that the laser welding process can induce high level of strains in columns of the laser platform, bearing the laser diode, responsible of an optical axis shift and a gradual drop of the optical power in relation with relaxation of accumulated stresses in the subassembly (W. M. Sherry et al., ldquoHigh performance optoelectronic packaging for 2.5 and 10 Gb/s laser modules,rdquo in Proc. Electron. Compon. Technol. Conf., 1996, pp. 620-627). Typical stresses are close to 160 MPa with drift about 5 MPa with the dispersion of energy level of the laser Nd: YAG beam. The introduction of both material and process dispersion in order to evaluate their impact on product lifetime distribution has been taking into account. In the case of thermal cycles, stresses can occur on elements sensitive to coefficient of thermal expansion mismatches such as solder joints between the laser platform and thermoelectric cooler and as fiber glued into the pigtail leading to crack propagation with sudden drop of optical power. A previous paper demonstrated that laser submount is the most sensitive part of optical system (Deshayes, et al., ldquoThree-dimensional FEM simulations of thermal mechanical stresses in 1.55 mum laser modules,rdquo Microelectron. Rel., vol. 43, no. 7, pp. 1125 -1136, Jul. 2003). Experimental analyses were also conducted to correlate simulation results and monitor the output optical power of laser modules after 500 thermal cycles ( -40degC/ + 85degC VRT).

Research paper thumbnail of Estimation of lifetime distributions on 1550 nm DFB laser diodes using Monte-Carlo statistic computations

HAL (Le Centre pour la Communication Scientifique Directe), 2004

ABSTRACT High performance and high reliability are two of the most important goals driving the pe... more ABSTRACT High performance and high reliability are two of the most important goals driving the penetration of optical transmission into telecommunication systems ranging from 880 nm to 1550 nm. Lifetime prediction defined as the time at which a parameter reaches its maximum acceptable shirt still stays the main result in terms of reliability estimation for a technology. For optoelectronic emissive components, selection tests and life testing are specifically used for reliability evaluation according to Telcordia GR-468 CORE requirements. This approach is based on extrapolation of degradation laws, based on physics of failure and electrical or optical parameters, allowing both strong test time reduction and long-term reliability prediction. Unfortunately, in the case of mature technology, there is a growing complexity to calculate average lifetime and failure rates (FITs) using ageing tests in particular due to extremely low failure rates. For present laser diode technologies, time to failure tend to be 106 hours aged under typical conditions (Popt=10 mW and T=80°C). These ageing tests must be performed on more than 100 components aged during 10000 hours mixing different temperatures and drive current conditions conducting to acceleration factors above 300-400. These conditions are high-cost, time consuming and cannot give a complete distribution of times to failure. A new approach consists in use statistic computations to extrapolate lifetime distribution and failure rates in operating conditions from physical parameters of experimental degradation laws. In this paper, Distributed Feedback single mode laser diodes (DFB-LD) used for 1550 nm telecommunication network working at 2.5 Gbit/s transfer rate are studied. Electrical and optical parameters have been measured before and after ageing tests, performed at constant current, according to Telcordia GR-468 requirements. Cumulative failure rates and lifetime distributions are computed using statistic calculations and equations of drift mechanisms versus time fitted from experimental measurements.