Zuhaib Sheikh - Academia.edu (original) (raw)
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Papers by Zuhaib Sheikh
Microelectromechanical Systems, 2005
We present a novel experimental method for measuring the mechanical properties of nano-thickness ... more We present a novel experimental method for measuring the mechanical properties of nano-thickness materials using a freestanding membrane test. Specially fabricated axisymmetric freestanding membranes are centrally deflected using a spherical indenter attached to a custom-designed MEMS load cell. Experiments on freestanding films allows us to determine directly the mechanical properties of the films, over a broad range of length scales, without the confounding effects of a substrate.
Presented here is an alternative methodology to the development of transmission line models for m... more Presented here is an alternative methodology to the development of transmission line models for multi-conductor interconnects in high speed integrated circuits. The methodology starts with the assumption that per unit length (p.u.l.) transmission line parametersi.e. p.u.l. resistance R, inductance L, capacitance C, and conductance Ghave been extracted using a two-dimensional RLCG extractor. The methodology relies upon a rational fitting algorithm called VECTFIT to express the parameters as a rational function expression, a form suitable for equivalent circuit generation using a commercial circuit simulator like HSPICE. The methodology has been numerically verified and implemented in the form of some select interconnecting scenarios for typical on-chip applications. The new methodology has also been compared with the previous methodology for robustness, accuracy and computational efficacy. iii To my Parents, My First Teachers iv ACKNOWLEDGMENTS First and foremost I would like to praise and thank God Almighty who has been showering his innumerable bounties upon me since the day I came as a helpless individual into this world. It is His utmost favor upon me that He provided me with the best adviser I could aspire for in the person of Prof. Andreas Cangellaris. Prof. Cangellaris' patient advice and insightful guidance have made this work possible and I consider myself deeply indebted to him for the rest of my life. His insightful discourses and discussions helped me look beyond the obvious mathematical concepts and dig deep into the underlying physical phenomena all the way to their engineering applications. I consider it a privilege to have been a part of his group.
Microelectromechanical Systems, 2005
We present a novel experimental method for measuring the mechanical properties of nano-thickness ... more We present a novel experimental method for measuring the mechanical properties of nano-thickness materials using a freestanding membrane test. Specially fabricated axisymmetric freestanding membranes are centrally deflected using a spherical indenter attached to a custom-designed MEMS load cell. Experiments on freestanding films allows us to determine directly the mechanical properties of the films, over a broad range of length scales, without the confounding effects of a substrate.
Presented here is an alternative methodology to the development of transmission line models for m... more Presented here is an alternative methodology to the development of transmission line models for multi-conductor interconnects in high speed integrated circuits. The methodology starts with the assumption that per unit length (p.u.l.) transmission line parametersi.e. p.u.l. resistance R, inductance L, capacitance C, and conductance Ghave been extracted using a two-dimensional RLCG extractor. The methodology relies upon a rational fitting algorithm called VECTFIT to express the parameters as a rational function expression, a form suitable for equivalent circuit generation using a commercial circuit simulator like HSPICE. The methodology has been numerically verified and implemented in the form of some select interconnecting scenarios for typical on-chip applications. The new methodology has also been compared with the previous methodology for robustness, accuracy and computational efficacy. iii To my Parents, My First Teachers iv ACKNOWLEDGMENTS First and foremost I would like to praise and thank God Almighty who has been showering his innumerable bounties upon me since the day I came as a helpless individual into this world. It is His utmost favor upon me that He provided me with the best adviser I could aspire for in the person of Prof. Andreas Cangellaris. Prof. Cangellaris' patient advice and insightful guidance have made this work possible and I consider myself deeply indebted to him for the rest of my life. His insightful discourses and discussions helped me look beyond the obvious mathematical concepts and dig deep into the underlying physical phenomena all the way to their engineering applications. I consider it a privilege to have been a part of his group.