luca niccolai - Academia.edu (original) (raw)

Papers by luca niccolai

Ieee Transactions on Instrumentation and Measurement, Jun 1, 1994

An improved code density test for flash A/D converters is proposed, revealing some dynamic phenom... more An improved code density test for flash A/D converters is proposed, revealing some dynamic phenomena (e.g., missing codes) hidden by the conventional approach. Formulas are reported for obtaining, from code density, effective noise estimates fully consistent with those provided by waveform analysis. Finally, it is shown that the variance of noise estimates obtained by time-domain analysis may be unacceptably large if the observation window is not properly chosen. Carlo Morandi (S'7 1-M'71) received the Doctor degree in electronic engineenng from the University of Bologna in 1971 Until 1986 he worked with the University of Bologna, D.E.I.S., first as Research Assistant and later as an Associate Professor of Electronic Instrumentation. In 1986 he became full Professor of Applied Electronics at the University of Ancona, and in 1988 he moved to the chair of Applied Electronics at the University of Parma, where he is at present Head of the Dipartimento dl Ingegnena dell' Informazione. The scope of his research interests gradually broadened from the electncal characterization of semiconductor test structures and devices (MOS capacitors, CCD's, EPROM cells) to the problems of VLSI reliability and testing (fault modeling, electron beam guided failure analysis) and to more general problems of instrumentation, with application in industry and in the biomedical field. He has authored or coauthored more than 80 technical papers in international journals and conference proceedings Luca Niccolai graduated in electronic engineering from the University of Bologna in 1986. In 1986/1987 he cooperated with the SGS Design Center in Ancona on CMOS design and with the Electronics Department of the University of Ancona on fault modeling. Then, he worked with A.E.A. on automatic controls and digital signal processing. Since 1989 he has been with the University of Parma, first on a Telettra S.p.A. grant, then as a Ph.D. student, in the field of A/D converter testing.

IEE Proceedings E Computers and Digital Techniques, 1988

Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modell... more Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modelling, Simulation ... Their effects are described, when possible, by logical fault models, and a fault list is compiled taking into account the possibility of occurrence of the assumed faults. ...

IEEE Transactions on Instrumentation and Measurement, 1994

An improved code density test for flash A/D converters is proposed, revealing some dynamic phenom... more An improved code density test for flash A/D converters is proposed, revealing some dynamic phenomena (e.g., missing codes) hidden by the conventional approach. Formulas are reported for obtaining, from code density, effective noise estimates fully consistent with those provided by waveform analysis. Finally, it is shown that the variance of noise estimates obtained by time-domain analysis may be unacceptably large if the observation window is not properly chosen. Carlo Morandi (S'7 1-M'71) received the Doctor degree in electronic engineenng from the University of Bologna in 1971 Until 1986 he worked with the University of Bologna, D.E.I.S., first as Research Assistant and later as an Associate Professor of Electronic Instrumentation. In 1986 he became full Professor of Applied Electronics at the University of Ancona, and in 1988 he moved to the chair of Applied Electronics at the University of Parma, where he is at present Head of the Dipartimento dl Ingegnena dell' Informazione. The scope of his research interests gradually broadened from the electncal characterization of semiconductor test structures and devices (MOS capacitors, CCD's, EPROM cells) to the problems of VLSI reliability and testing (fault modeling, electron beam guided failure analysis) and to more general problems of instrumentation, with application in industry and in the biomedical field. He has authored or coauthored more than 80 technical papers in international journals and conference proceedings Luca Niccolai graduated in electronic engineering from the University of Bologna in 1986. In 1986/1987 he cooperated with the SGS Design Center in Ancona on CMOS design and with the Electronics Department of the University of Ancona on fault modeling. Then, he worked with A.E.A. on automatic controls and digital signal processing. Since 1989 he has been with the University of Parma, first on a Telettra S.p.A. grant, then as a Ph.D. student, in the field of A/D converter testing.

Iee Proceedings E Computers and Digital Techniques, 1988

Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modell... more Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modelling, Simulation ... Their effects are described, when possible, by logical fault models, and a fault list is compiled taking into account the possibility of occurrence of the assumed faults. ...

Ieee Transactions on Instrumentation and Measurement, Jun 1, 1994

An improved code density test for flash A/D converters is proposed, revealing some dynamic phenom... more An improved code density test for flash A/D converters is proposed, revealing some dynamic phenomena (e.g., missing codes) hidden by the conventional approach. Formulas are reported for obtaining, from code density, effective noise estimates fully consistent with those provided by waveform analysis. Finally, it is shown that the variance of noise estimates obtained by time-domain analysis may be unacceptably large if the observation window is not properly chosen. Carlo Morandi (S'7 1-M'71) received the Doctor degree in electronic engineenng from the University of Bologna in 1971 Until 1986 he worked with the University of Bologna, D.E.I.S., first as Research Assistant and later as an Associate Professor of Electronic Instrumentation. In 1986 he became full Professor of Applied Electronics at the University of Ancona, and in 1988 he moved to the chair of Applied Electronics at the University of Parma, where he is at present Head of the Dipartimento dl Ingegnena dell' Informazione. The scope of his research interests gradually broadened from the electncal characterization of semiconductor test structures and devices (MOS capacitors, CCD's, EPROM cells) to the problems of VLSI reliability and testing (fault modeling, electron beam guided failure analysis) and to more general problems of instrumentation, with application in industry and in the biomedical field. He has authored or coauthored more than 80 technical papers in international journals and conference proceedings Luca Niccolai graduated in electronic engineering from the University of Bologna in 1986. In 1986/1987 he cooperated with the SGS Design Center in Ancona on CMOS design and with the Electronics Department of the University of Ancona on fault modeling. Then, he worked with A.E.A. on automatic controls and digital signal processing. Since 1989 he has been with the University of Parma, first on a Telettra S.p.A. grant, then as a Ph.D. student, in the field of A/D converter testing.

IEE Proceedings E Computers and Digital Techniques, 1988

Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modell... more Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modelling, Simulation ... Their effects are described, when possible, by logical fault models, and a fault list is compiled taking into account the possibility of occurrence of the assumed faults. ...

IEEE Transactions on Instrumentation and Measurement, 1994

An improved code density test for flash A/D converters is proposed, revealing some dynamic phenom... more An improved code density test for flash A/D converters is proposed, revealing some dynamic phenomena (e.g., missing codes) hidden by the conventional approach. Formulas are reported for obtaining, from code density, effective noise estimates fully consistent with those provided by waveform analysis. Finally, it is shown that the variance of noise estimates obtained by time-domain analysis may be unacceptably large if the observation window is not properly chosen. Carlo Morandi (S'7 1-M'71) received the Doctor degree in electronic engineenng from the University of Bologna in 1971 Until 1986 he worked with the University of Bologna, D.E.I.S., first as Research Assistant and later as an Associate Professor of Electronic Instrumentation. In 1986 he became full Professor of Applied Electronics at the University of Ancona, and in 1988 he moved to the chair of Applied Electronics at the University of Parma, where he is at present Head of the Dipartimento dl Ingegnena dell' Informazione. The scope of his research interests gradually broadened from the electncal characterization of semiconductor test structures and devices (MOS capacitors, CCD's, EPROM cells) to the problems of VLSI reliability and testing (fault modeling, electron beam guided failure analysis) and to more general problems of instrumentation, with application in industry and in the biomedical field. He has authored or coauthored more than 80 technical papers in international journals and conference proceedings Luca Niccolai graduated in electronic engineering from the University of Bologna in 1986. In 1986/1987 he cooperated with the SGS Design Center in Ancona on CMOS design and with the Electronics Department of the University of Ancona on fault modeling. Then, he worked with A.E.A. on automatic controls and digital signal processing. Since 1989 he has been with the University of Parma, first on a Telettra S.p.A. grant, then as a Ph.D. student, in the field of A/D converter testing.

Iee Proceedings E Computers and Digital Techniques, 1988

Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modell... more Page 1. ECL fault modelling C. Morandi L. Niccolai F. Fantini S. Gaviraghi Indexing terms: Modelling, Simulation ... Their effects are described, when possible, by logical fault models, and a fault list is compiled taking into account the possibility of occurrence of the assumed faults. ...