Thermal characterization of amorphous selenium films obtained by low-temperature photodeposition (original) (raw)

Abstract

The thermal treatment structural behaviour of amorphous selenium (a-Se) films as obtained by a low-temperature photodeposition process was studied. Differential scanning calorimetry (DSC) measurements were used to obtain detailed information regarding the structural changes in the temperature range of −50–250 ‡C. Our understanding of the crystallization behaviour was also aided by scanning electron microscopy (SEM) and X-ray diffraction analysis (XRD). The results were compared to other observations made on structural transitions of a-Se obtained traditionally by high-temperature processes such as quenching from the melt and vacuum deposition. Comparing the DSC thermograms clearly shows that the low-temperature photodeposition process gives a different structural transition behaviour of a-Se during thermal crystallization. Specifically new transitions were observed structurally in the temperature range 80–160‡C.

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Authors and Affiliations

  1. Center for Technological Education, aff. Tel-Aviv University, 52 Golomb St., 58368, Holon, Israel
    A. Peled
  2. Department of Polymer Chemistry, University of Groningen, Nijenborgh 16, 9747, AG Groningen, The Netherlands
    E. Hadziioannou

Authors

  1. A. Peled
  2. E. Hadziioannou

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Peled, A., Hadziioannou, E. Thermal characterization of amorphous selenium films obtained by low-temperature photodeposition.J Mater Sci 26, 1769–1774 (1991). https://doi.org/10.1007/BF00543600

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