Mark W Keller | National Institute of Standards and Technology (original) (raw)

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Papers by Mark W Keller

Research paper thumbnail of Effects of Stray Magnetic Field on Transition-Edge Sensors in Gamma-Ray Microcalorimeters

Journal of low temperature physics, May 19, 2024

Research paper thumbnail of Why the Long-term Charge Offset Drift in Si SET Transistors is Much Better than Metal-Based Ones: TLF Stability

Bulletin of the American Physical Society, Mar 12, 2008

Research paper thumbnail of Single-photon pump

Applied Physics Letters, Aug 21, 2006

Research paper thumbnail of Measurement of Background Charges, Electron Temperature, and Junction Capacitances in an Electron Pump

APS March Meeting Abstracts, Mar 1, 1997

ABSTRACT Fluctuations in the background charges of the tunnel junctions in the electron pump limi... more ABSTRACT Fluctuations in the background charges of the tunnel junctions in the electron pump limit the accuracy of the device over long times. We have measured the background charge on each junction as follows. We create a charge bias by applying voltages of opposite polarity to the gates on either side of the junction. As this bias is swept from 0 to e, the junction allows tunneling when the sum of the background charge and the applied charge is equal to 0.5e. Thus if tunneling occurs at an applied bias of 0.6e, we infer a background charge of -0.1e. Since the tunneling signal is thermally broadened, the measurement also yields the electron temperature of the junctions. We report several results based on this technique. 1) The rate and amplitude of the background charge fluctuations decrease over a period of about 2 weeks at 40 mK. 2) The electron temperature follows the refrigerator temperature down to 40 mK. This shows conclusively that electron heating cannot explain our earlier observation that pump accuracy is independent of temperature below 100 mK. 3) Using the known temperature, we infer the total capacitance of each junction and find nearly the same value for all junctions. These results significantly improve our ability to compare our observed error rates with theory.

Research paper thumbnail of CVD growth of large-grain graphene on Cu(111) thin films

Bulletin of the American Physical Society, Mar 18, 2013

Research paper thumbnail of Measurement of the frequency dependence of a single-electron tunneling capacitance standard

Research paper thumbnail of Single-electron transistor spectroscopy of InGaAs self-assembled quantum dots

Physica E-low-dimensional Systems & Nanostructures, Mar 1, 2004

Research paper thumbnail of Rare Errors in a Well-Characterized Electron Pump: Comparison of Experiment and Theory

Physical Review Letters, May 18, 1998

Research paper thumbnail of A capacitance standard based on counting electrons

Research paper thumbnail of Counting errors in a voltage-biased electron pump

Physical review, Apr 30, 2003

Research paper thumbnail of Leakage and counting errors in a seven-junction electron pump

Physical review, Sep 15, 1999

Research paper thumbnail of Noise-induced leakage and counting errors in the electron pump

Physical review, Dec 15, 2000

Research paper thumbnail of Photon-Assisted Tunneling in Electron Pumps

Physical Review Letters, May 29, 2000

Research paper thumbnail of Capacitance Spectroscopy of Self-Assembled Quantum Dots using Single-Electron Transistors

APS March Meeting Abstracts, Mar 1, 2003

We are studying the tunneling of individual electrons into self-assembled InAs quantum dots with ... more We are studying the tunneling of individual electrons into self-assembled InAs quantum dots with single-electron transistors. Aluminum single-electron transistors were fabricated over an epitaxial structure including self-assembled InAs quantum dots and an underlying n-doped layer. Sweeping the potential on the n-doped layer causes individual electrons to tunnel onto a quantum dot, and is detected capacitively with a single electron transistor.

Research paper thumbnail of Uncertainty budget for the NIST electron counting capacitance standard, ECCS-1

Research paper thumbnail of Examination of the Charge Quantum in a Single-Electron Pump

Bulletin of the American Physical Society, Mar 7, 2007

Research paper thumbnail of Symmetry-dependent ultrafast manipulation of nanoscale magnetic domains

arXiv (Cornell University), Dec 17, 2021

Research paper thumbnail of VARIABILITY OF CHARGE NOISE IN Al-BASED SET TRANSISTORS | NIST

Research paper thumbnail of Far above bandgap photonics: attosecond dynamics of highly excited electrons in materials

Research paper thumbnail of Elementary again

Research paper thumbnail of Effects of Stray Magnetic Field on Transition-Edge Sensors in Gamma-Ray Microcalorimeters

Journal of low temperature physics, May 19, 2024

Research paper thumbnail of Why the Long-term Charge Offset Drift in Si SET Transistors is Much Better than Metal-Based Ones: TLF Stability

Bulletin of the American Physical Society, Mar 12, 2008

Research paper thumbnail of Single-photon pump

Applied Physics Letters, Aug 21, 2006

Research paper thumbnail of Measurement of Background Charges, Electron Temperature, and Junction Capacitances in an Electron Pump

APS March Meeting Abstracts, Mar 1, 1997

ABSTRACT Fluctuations in the background charges of the tunnel junctions in the electron pump limi... more ABSTRACT Fluctuations in the background charges of the tunnel junctions in the electron pump limit the accuracy of the device over long times. We have measured the background charge on each junction as follows. We create a charge bias by applying voltages of opposite polarity to the gates on either side of the junction. As this bias is swept from 0 to e, the junction allows tunneling when the sum of the background charge and the applied charge is equal to 0.5e. Thus if tunneling occurs at an applied bias of 0.6e, we infer a background charge of -0.1e. Since the tunneling signal is thermally broadened, the measurement also yields the electron temperature of the junctions. We report several results based on this technique. 1) The rate and amplitude of the background charge fluctuations decrease over a period of about 2 weeks at 40 mK. 2) The electron temperature follows the refrigerator temperature down to 40 mK. This shows conclusively that electron heating cannot explain our earlier observation that pump accuracy is independent of temperature below 100 mK. 3) Using the known temperature, we infer the total capacitance of each junction and find nearly the same value for all junctions. These results significantly improve our ability to compare our observed error rates with theory.

Research paper thumbnail of CVD growth of large-grain graphene on Cu(111) thin films

Bulletin of the American Physical Society, Mar 18, 2013

Research paper thumbnail of Measurement of the frequency dependence of a single-electron tunneling capacitance standard

Research paper thumbnail of Single-electron transistor spectroscopy of InGaAs self-assembled quantum dots

Physica E-low-dimensional Systems & Nanostructures, Mar 1, 2004

Research paper thumbnail of Rare Errors in a Well-Characterized Electron Pump: Comparison of Experiment and Theory

Physical Review Letters, May 18, 1998

Research paper thumbnail of A capacitance standard based on counting electrons

Research paper thumbnail of Counting errors in a voltage-biased electron pump

Physical review, Apr 30, 2003

Research paper thumbnail of Leakage and counting errors in a seven-junction electron pump

Physical review, Sep 15, 1999

Research paper thumbnail of Noise-induced leakage and counting errors in the electron pump

Physical review, Dec 15, 2000

Research paper thumbnail of Photon-Assisted Tunneling in Electron Pumps

Physical Review Letters, May 29, 2000

Research paper thumbnail of Capacitance Spectroscopy of Self-Assembled Quantum Dots using Single-Electron Transistors

APS March Meeting Abstracts, Mar 1, 2003

We are studying the tunneling of individual electrons into self-assembled InAs quantum dots with ... more We are studying the tunneling of individual electrons into self-assembled InAs quantum dots with single-electron transistors. Aluminum single-electron transistors were fabricated over an epitaxial structure including self-assembled InAs quantum dots and an underlying n-doped layer. Sweeping the potential on the n-doped layer causes individual electrons to tunnel onto a quantum dot, and is detected capacitively with a single electron transistor.

Research paper thumbnail of Uncertainty budget for the NIST electron counting capacitance standard, ECCS-1

Research paper thumbnail of Examination of the Charge Quantum in a Single-Electron Pump

Bulletin of the American Physical Society, Mar 7, 2007

Research paper thumbnail of Symmetry-dependent ultrafast manipulation of nanoscale magnetic domains

arXiv (Cornell University), Dec 17, 2021

Research paper thumbnail of VARIABILITY OF CHARGE NOISE IN Al-BASED SET TRANSISTORS | NIST

Research paper thumbnail of Far above bandgap photonics: attosecond dynamics of highly excited electrons in materials

Research paper thumbnail of Elementary again

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