Automation of the collection and processing of X-ray diffraction data -- a generic approach - PubMed (original) (raw)

Review

. 2002 Nov;58(Pt 11):1924-8.

doi: 10.1107/s0907444902016864. Epub 2002 Oct 21.

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Review

Automation of the collection and processing of X-ray diffraction data -- a generic approach

A G W Leslie et al. Acta Crystallogr D Biol Crystallogr. 2002 Nov.

Abstract

With modern detectors and synchrotron sources, it is now routine to collect complete data sets in 10-30 min. To make the most efficient use of these resources, it is desirable to automate the collection and processing of the diffraction data, ideally to a level at which multiple data sets can be acquired without any intervention. A scheme is described to allow fully automated data collection and processing. The design is modular, so that it can easily be interfaced with different beamline-control programs and different data-processing programs. An expert system provides a communication path between the data-processing software and the beamline-control software and takes decisions about the data collection based on project information provided by the user and experimental data provided by the data-processing program.

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