Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector - PubMed (original) (raw)
Five-element Johann-type x-ray emission spectrometer with a single-photon-counting pixel detector
Evgeny Kleymenov et al. Rev Sci Instrum. 2011 Jun.
Abstract
A Johann-type spectrometer with five spherically bent crystals and a pixel detector was constructed for a range of hard x-ray photon-in photon-out synchrotron techniques, covering a Bragg-angle range of 60°-88°. The spectrometer provides a sub emission line width energy resolution from sub-eV to a few eV and precise energy calibration, better than 1.5 eV for the full range of Bragg angles. The use of a pixel detector allows fast and easy optimization of the signal-to-background ratio. A concentration detection limit below 0.4 wt% was reached at the Cu Kα(1) line. The spectrometer is designed as a modular mobile device for easy integration in a multi-purpose hard x-ray synchrotron beamline, such as the SuperXAS beamline at the Swiss Light Source.
© 2011 American Institute of Physics
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