Gary NG | South China University of Technology (original) (raw)
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Papers by Gary NG
A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave... more A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave integrated circuit) manufacturing control. The optimal process/test strategy of a MMIC in the production phase can be predicted from this model. A method using an optimization concept is demonstrated for calculating parameters of the CIT model from process/test history. This method can be used to estimate realistic screening probabilities and hence to predict optimal test strategy accurately. The method is described, and examples of its use are presented.>
IEEE Transactions on Semiconductor Manufacturing, 1992
A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integ... more A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integrated circuit (MMIC) production control. The optimal process/test strategy for an MMIC in production phase can easily be predicted from this model. The adaptive nature of the CIT model also suggests suitability of the screen criteria and quantifies the necessity of each test step. Application of this CIT method to MMIC manufacturing will result in significant cost reductions. The CIT theory and application examples are presented in this paper.
A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave... more A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave integrated circuit) production control. The optimal process/test strategy for a MMIC in the production phase can be easily predicted from this model. For early detection of the unqualified wafers or chips, the adaptive nature of the CIT model also suggests suitability of the screen criteria and the necessity of each test step. These advantages result in cost reduction for MMIC manufacturing. The CIT theory and application examples are presented
A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave... more A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave integrated circuit) manufacturing control. The optimal process/test strategy of a MMIC in the production phase can be predicted from this model. A method using an optimization concept is demonstrated for calculating parameters of the CIT model from process/test history. This method can be used to estimate realistic screening probabilities and hence to predict optimal test strategy accurately. The method is described, and examples of its use are presented.>
IEEE Transactions on Semiconductor Manufacturing, 1992
A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integ... more A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integrated circuit (MMIC) production control. The optimal process/test strategy for an MMIC in production phase can easily be predicted from this model. The adaptive nature of the CIT model also suggests suitability of the screen criteria and quantifies the necessity of each test step. Application of this CIT method to MMIC manufacturing will result in significant cost reductions. The CIT theory and application examples are presented in this paper.
A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave... more A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave integrated circuit) production control. The optimal process/test strategy for a MMIC in the production phase can be easily predicted from this model. For early detection of the unqualified wafers or chips, the adaptive nature of the CIT model also suggests suitability of the screen criteria and the necessity of each test step. These advantages result in cost reduction for MMIC manufacturing. The CIT theory and application examples are presented