Philip Shirvani | Stanford University (original) (raw)
Uploads
Papers by Philip Shirvani
Proceedings, IEEE Aerospace Conference, 2002
The Advanced Space Computing and Autonomy Testbed on the ARGOS satellite provides the first direc... more The Advanced Space Computing and Autonomy Testbed on the ARGOS satellite provides the first direct, on orbit comparison of a modem radiation hardened 32 bit processor with a similar COTS processor. This investigation was motivated by the need for higher capability computers for space flight use than could be met with available radiation hardened components. The use of COTS devices for space applications has been suggested to accelerate the development cycle and produce cost effective systems. Software-implemented corrections of radiation-induced SEUs (SIHFT) can provide low-cost solutions for enhancing the reliability of these systems. We have flown two 32-bit single board computers (SBCs) onboard the ARGOS spacecraft. One is full COTS, while the other is RAD-hard. The COTS board has an order of magnitude higher computational throughput than the RAD-hard board, offsetting the performance overhead of the SIHFT techniques used on the COTS board while consuming less power.
Proceedings Sixth International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2000) (Cat. No. PR00586), 2000
Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146), 1999
A major concern in digital electronics used in space is radiation-induced transient errors. Radia... more A major concern in digital electronics used in space is radiation-induced transient errors. Radiation hardening is an effective yet costly solution to this problem. Commercial off-the-shelf (COTS) components have been considered as a low-cost alternative to radiation- hardened parts. In ARGOS project 1, these two approaches are compared in an actual space experiment. We assess the effectiveness of Software-Implemented Hardware Fault Tolerance (SIHFT) techniques in enhancing the reliability of COTS.
IEEE Transactions on Reliability, 2000
IEEE Transactions on Reliability, 2002
IEEE Transactions on Reliability, 2002
Proceedings, IEEE Aerospace Conference, 2002
The Advanced Space Computing and Autonomy Testbed on the ARGOS satellite provides the first direc... more The Advanced Space Computing and Autonomy Testbed on the ARGOS satellite provides the first direct, on orbit comparison of a modem radiation hardened 32 bit processor with a similar COTS processor. This investigation was motivated by the need for higher capability computers for space flight use than could be met with available radiation hardened components. The use of COTS devices for space applications has been suggested to accelerate the development cycle and produce cost effective systems. Software-implemented corrections of radiation-induced SEUs (SIHFT) can provide low-cost solutions for enhancing the reliability of these systems. We have flown two 32-bit single board computers (SBCs) onboard the ARGOS spacecraft. One is full COTS, while the other is RAD-hard. The COTS board has an order of magnitude higher computational throughput than the RAD-hard board, offsetting the performance overhead of the SIHFT techniques used on the COTS board while consuming less power.
Proceedings Sixth International Symposium on Advanced Research in Asynchronous Circuits and Systems (ASYNC 2000) (Cat. No. PR00586), 2000
Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146), 1999
A major concern in digital electronics used in space is radiation-induced transient errors. Radia... more A major concern in digital electronics used in space is radiation-induced transient errors. Radiation hardening is an effective yet costly solution to this problem. Commercial off-the-shelf (COTS) components have been considered as a low-cost alternative to radiation- hardened parts. In ARGOS project 1, these two approaches are compared in an actual space experiment. We assess the effectiveness of Software-Implemented Hardware Fault Tolerance (SIHFT) techniques in enhancing the reliability of COTS.
IEEE Transactions on Reliability, 2000
IEEE Transactions on Reliability, 2002
IEEE Transactions on Reliability, 2002