I. Filanovsky | University of Alberta (original) (raw)

Papers by I. Filanovsky

2008 IEEE International Test Conference, 2008

Non-contact methods for testing system-on-chip (SoC) and system in package (SIP) assemblies are p... more Non-contact methods for testing system-on-chip (SoC) and system in package (SIP) assemblies are presented. This method allows for high speed testing at the wafer level for SoCs as well as testing during and after assembly for panel or wafer level SIP technologies. Wafer testing at advanced nodes is carried out without damaging underlying metallurgy - an issue with current contact testing techniques. The technology utilizes non-contact GHz short-range transceivers to transfer test signals and results to and from SoC ICs. The wireless probes convert standard tester ATE logic levels to high frequency RF (GHz) transceiver signals and thus allow the use of standard test equipment. A reduced set of contact probes are used for test power only. A 45 nm fully CMOS compatible IC with wireless test transceivers is designed and fabricated. Enhancing the reliability and economics of IC manufacture by enabling non-contact testing of SoCs before and during packaging is a key benefit of this technology.

48th Midwest Symposium on Circuits and Systems, 2005., 2005

Abstract—A group of low-voltage power supply voltage references has been developed. The circuits ... more Abstract—A group of low-voltage power supply voltage references has been developed. The circuits are designed with the assumptions that the difference of threshold voltages is nearly constant in the wide range of temperatures, and that mobilities are tracking each other ...

International Journal of Electronics, 1991

A current-controlled multivibrator using operational transconductance amplifiers (OTAs) is propos... more A current-controlled multivibrator using operational transconductance amplifiers (OTAs) is proposed and the circuit operation is described. The frequency of oscillationsfo is calculated (both bipolar and MOS OTAs are treated). The circuit allows operation with a low voltage power supply. An example describes the experimental results for the multivibrator realized with CA3080 OTA integrated circuits. Linear control of fo over a two decade range (500Hz-SO kHz) is obtained with the minimum rated power supply voltage of ±2V.

IEEE International Conference on Test, 2005.

A method for wireless, noncontact testing of semiconductor wafers is presented. The technology ap... more A method for wireless, noncontact testing of semiconductor wafers is presented. The technology applies to chips with active electronics, including standard integrated circuits (ICs), which require testing at the wafer level. The technology relies on short-range, near field communications to transfer data at gigabit per second rates between the probe card and the device under test (DUT) on a wafer.

… Conference, 2008. MNRC …, 2008

A circuit for wide range frequency modulation and control in a quadrature ring oscillator for mul... more A circuit for wide range frequency modulation and control in a quadrature ring oscillator for multiband FM/FSK transmitter is presented. The modulation and control signal are applied to the oscillator transmission gates via the floating current source circuit. The current of this source repeats the input control current that includes two components, one of which tunes the mid-frequency and the other tunes the modulation depth. Each of the control components is set independently. This precise and wide-range frequency control allows one to use it in multiband applications. The proposed circuit is designed in 0.18µm standard digital CMOS process for intended carrier frequencies of two ISM bands (900 MHz, and 2.4 GHz). I.

2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS), 2012

IEEE Journal of Solid-State Circuits, 2000

Proceedings of Canadian Conference on Electrical and Computer Engineering, 1993

2007 IEEE International Test Conference, 2007

A non-contact method for parallel testing of System-in-Package (SiP) assemblies is presented. Thi... more A non-contact method for parallel testing of System-in-Package (SiP) assemblies is presented. This technology allows for JTAG testing of partially or fully populated SiPs in wafer form, in advance of final packaging. The technology utilizes non-contact GHz short-range, near field communications to transfer bi-directional data to SiP substrates; creating a Wireless Test Access Port or WTAP. The system is integrated with a standard probe card to deliver power and wireless signals. The wireless probes convert high frequency RF (GHz) transceiver signals to standard tester ATE logic levels and allow the use of standard probers and JTAG testers. In addition, all transceivers (DUT and probe) use antenna structures and electronics that are fully CMOS compliant. Enhancing the economics of SiP manufacture by enabling parallel non-contact testing of SiPs before packaging is a key benefit of this technology.

Proceedings of 1994 37th Midwest Symposium on Circuits and Systems, 1994

A bipolar high precision voltage-to-frequency converter is described. The circuit includes an inp... more A bipolar high precision voltage-to-frequency converter is described. The circuit includes an input voltage-to-current conversion stage followed by current-controlled multivibrator. The multivibrator trigger includes a window comparator with a limiter of the output voltage swing, and the timing capacitor discharge current is switched simultaneously with the window comparator bias. This allows to obtain high resolution near both trigger thresholds. The

Proceedings of the 39th Midwest Symposium on Circuits and Systems, 1996

... I. M. Filanovsky' Yiu Fai Chan2 University of Alberta Edmonton, Alberta, Canada T6G ... more ... I. M. Filanovsky' Yiu Fai Chan2 University of Alberta Edmonton, Alberta, Canada T6G 2E1 ... Theoretical calculations show that the thermal instability of the output reference voltage can be reduced down to 0.2 ppm/"C. The simulation results for the circuits obtained by extraction ...

Midwest Symposium on Circuits and Systems, 2000

Mutual compensation of mobility and threshold voltage temperature variations may result in a zero... more Mutual compensation of mobility and threshold voltage temperature variations may result in a zero temperature coefficient (ZTC) bias point of an MOS transistor. In this case the temperature dependence of the output voltage for a diode-connected transistor is a linear function of absolute temperature with the slope controlled by bias current. The paper describes application of this temperature dependence to

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512), 2000

ABSTRACT The structural design methodology is applied to class AB opamp output stages. As a start... more ABSTRACT The structural design methodology is applied to class AB opamp output stages. As a starting point the stage generalized signal graph is proposed. The graphs of few common output stages are analyzed, and it is shown that this analysis helps to find their drawbacks. The general graphs may have many realizations, and the choice of cells for realization and generation of new circuit solutions for CMOS and bipolar output stages is outlined. The micropower bipolar and low-voltage (1.2 V) CMOS output stages are given as examples.

IEEE Transactions on Circuits and Systems, 1987

ABSTRACT A method for verification of stability of periodic oscillations in nonlinear systems is ... more ABSTRACT A method for verification of stability of periodic oscillations in nonlinear systems is proposed. The main oscillation is represented in the exponential form and is substituted into the initial differential equation. Then the approximating differential equation with respect to the same exponent is taken. The terms representing higher than the first-order derivatives are omitted in the corresponding operator equation. The real and imaginary parts of this simplified operator equation are separated and give two nonlinear differential equation of the first order for the amplitudes of the main oscillation. These equations can be used for calculation of transients. The differential equations of variations obtained from the equations of the amplitudes are used for verification of stability of the main oscillation.

IEEE Transactions on Circuits and Systems, 1987

Abstract -An analytic approach which combines the harmonic balance method and perturbation techni... more Abstract -An analytic approach which combines the harmonic balance method and perturbation techniques is used for calculation of the periodic solutions of the van der Pol equation with p = 0-3. An approximate solution which includes a few main harmonics can be found by the ...

2007 14th IEEE International Conference on Electronics, Circuits and Systems, 2007

ABSTRACT Not Available

ABSTRACT The paper considers the linear feedback systems built around cut-inserted ideal transfor... more ABSTRACT The paper considers the linear feedback systems built around cut-inserted ideal transformers. It is shown that introducing the second additional transformer in cascade connection with the first one and doing the cut in the wire between the transformers one may reduce this method to the previously known Cut-Insertion Theorem (CIT) method. The cut-inserted ideal transformer method is reduced to the second form of the cut-inserted two-port including a voltage source on one side of the cut and a current source on the other side. Then, in the usual way, one obtains the parameters of the feedback system of order two (i.e. having two essential nodes). This system requires consideration of three loops; it may be further analyzed using Mason's rules.

IEEE Transactions on Circuits and Systems, 1987

Two models are compared which describe amplitude transients in an oscillator with an amplitude co... more Two models are compared which describe amplitude transients in an oscillator with an amplitude control system. The approximate model is a linearization of the more complicated exponential model. Using an amplitude control system that employs squaring circuits to derive the control signal, the two equations are solved in closed form and the transient responses are compared. It is found that

The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002., 2002

The transconductance characteristics of MOS transistors realized in 0.18 μm CMOS technology have ... more The transconductance characteristics of MOS transistors realized in 0.18 μm CMOS technology have a zero-temperature coefficient (ZTC) bias point. The presence of this point influences performance of both analog and digital circuits. The offset voltage drift in a source-coupled differential pair strongly increases, if the transistor drain currents are equal to the bias currents of ZTC point. It is also

2008 IEEE International Test Conference, 2008

Non-contact methods for testing system-on-chip (SoC) and system in package (SIP) assemblies are p... more Non-contact methods for testing system-on-chip (SoC) and system in package (SIP) assemblies are presented. This method allows for high speed testing at the wafer level for SoCs as well as testing during and after assembly for panel or wafer level SIP technologies. Wafer testing at advanced nodes is carried out without damaging underlying metallurgy - an issue with current contact testing techniques. The technology utilizes non-contact GHz short-range transceivers to transfer test signals and results to and from SoC ICs. The wireless probes convert standard tester ATE logic levels to high frequency RF (GHz) transceiver signals and thus allow the use of standard test equipment. A reduced set of contact probes are used for test power only. A 45 nm fully CMOS compatible IC with wireless test transceivers is designed and fabricated. Enhancing the reliability and economics of IC manufacture by enabling non-contact testing of SoCs before and during packaging is a key benefit of this technology.

48th Midwest Symposium on Circuits and Systems, 2005., 2005

Abstract—A group of low-voltage power supply voltage references has been developed. The circuits ... more Abstract—A group of low-voltage power supply voltage references has been developed. The circuits are designed with the assumptions that the difference of threshold voltages is nearly constant in the wide range of temperatures, and that mobilities are tracking each other ...

International Journal of Electronics, 1991

A current-controlled multivibrator using operational transconductance amplifiers (OTAs) is propos... more A current-controlled multivibrator using operational transconductance amplifiers (OTAs) is proposed and the circuit operation is described. The frequency of oscillationsfo is calculated (both bipolar and MOS OTAs are treated). The circuit allows operation with a low voltage power supply. An example describes the experimental results for the multivibrator realized with CA3080 OTA integrated circuits. Linear control of fo over a two decade range (500Hz-SO kHz) is obtained with the minimum rated power supply voltage of ±2V.

IEEE International Conference on Test, 2005.

A method for wireless, noncontact testing of semiconductor wafers is presented. The technology ap... more A method for wireless, noncontact testing of semiconductor wafers is presented. The technology applies to chips with active electronics, including standard integrated circuits (ICs), which require testing at the wafer level. The technology relies on short-range, near field communications to transfer data at gigabit per second rates between the probe card and the device under test (DUT) on a wafer.

… Conference, 2008. MNRC …, 2008

A circuit for wide range frequency modulation and control in a quadrature ring oscillator for mul... more A circuit for wide range frequency modulation and control in a quadrature ring oscillator for multiband FM/FSK transmitter is presented. The modulation and control signal are applied to the oscillator transmission gates via the floating current source circuit. The current of this source repeats the input control current that includes two components, one of which tunes the mid-frequency and the other tunes the modulation depth. Each of the control components is set independently. This precise and wide-range frequency control allows one to use it in multiband applications. The proposed circuit is designed in 0.18µm standard digital CMOS process for intended carrier frequencies of two ISM bands (900 MHz, and 2.4 GHz). I.

2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS), 2012

IEEE Journal of Solid-State Circuits, 2000

Proceedings of Canadian Conference on Electrical and Computer Engineering, 1993

2007 IEEE International Test Conference, 2007

A non-contact method for parallel testing of System-in-Package (SiP) assemblies is presented. Thi... more A non-contact method for parallel testing of System-in-Package (SiP) assemblies is presented. This technology allows for JTAG testing of partially or fully populated SiPs in wafer form, in advance of final packaging. The technology utilizes non-contact GHz short-range, near field communications to transfer bi-directional data to SiP substrates; creating a Wireless Test Access Port or WTAP. The system is integrated with a standard probe card to deliver power and wireless signals. The wireless probes convert high frequency RF (GHz) transceiver signals to standard tester ATE logic levels and allow the use of standard probers and JTAG testers. In addition, all transceivers (DUT and probe) use antenna structures and electronics that are fully CMOS compliant. Enhancing the economics of SiP manufacture by enabling parallel non-contact testing of SiPs before packaging is a key benefit of this technology.

Proceedings of 1994 37th Midwest Symposium on Circuits and Systems, 1994

A bipolar high precision voltage-to-frequency converter is described. The circuit includes an inp... more A bipolar high precision voltage-to-frequency converter is described. The circuit includes an input voltage-to-current conversion stage followed by current-controlled multivibrator. The multivibrator trigger includes a window comparator with a limiter of the output voltage swing, and the timing capacitor discharge current is switched simultaneously with the window comparator bias. This allows to obtain high resolution near both trigger thresholds. The

Proceedings of the 39th Midwest Symposium on Circuits and Systems, 1996

... I. M. Filanovsky' Yiu Fai Chan2 University of Alberta Edmonton, Alberta, Canada T6G ... more ... I. M. Filanovsky' Yiu Fai Chan2 University of Alberta Edmonton, Alberta, Canada T6G 2E1 ... Theoretical calculations show that the thermal instability of the output reference voltage can be reduced down to 0.2 ppm/"C. The simulation results for the circuits obtained by extraction ...

Midwest Symposium on Circuits and Systems, 2000

Mutual compensation of mobility and threshold voltage temperature variations may result in a zero... more Mutual compensation of mobility and threshold voltage temperature variations may result in a zero temperature coefficient (ZTC) bias point of an MOS transistor. In this case the temperature dependence of the output voltage for a diode-connected transistor is a linear function of absolute temperature with the slope controlled by bias current. The paper describes application of this temperature dependence to

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512), 2000

ABSTRACT The structural design methodology is applied to class AB opamp output stages. As a start... more ABSTRACT The structural design methodology is applied to class AB opamp output stages. As a starting point the stage generalized signal graph is proposed. The graphs of few common output stages are analyzed, and it is shown that this analysis helps to find their drawbacks. The general graphs may have many realizations, and the choice of cells for realization and generation of new circuit solutions for CMOS and bipolar output stages is outlined. The micropower bipolar and low-voltage (1.2 V) CMOS output stages are given as examples.

IEEE Transactions on Circuits and Systems, 1987

ABSTRACT A method for verification of stability of periodic oscillations in nonlinear systems is ... more ABSTRACT A method for verification of stability of periodic oscillations in nonlinear systems is proposed. The main oscillation is represented in the exponential form and is substituted into the initial differential equation. Then the approximating differential equation with respect to the same exponent is taken. The terms representing higher than the first-order derivatives are omitted in the corresponding operator equation. The real and imaginary parts of this simplified operator equation are separated and give two nonlinear differential equation of the first order for the amplitudes of the main oscillation. These equations can be used for calculation of transients. The differential equations of variations obtained from the equations of the amplitudes are used for verification of stability of the main oscillation.

IEEE Transactions on Circuits and Systems, 1987

Abstract -An analytic approach which combines the harmonic balance method and perturbation techni... more Abstract -An analytic approach which combines the harmonic balance method and perturbation techniques is used for calculation of the periodic solutions of the van der Pol equation with p = 0-3. An approximate solution which includes a few main harmonics can be found by the ...

2007 14th IEEE International Conference on Electronics, Circuits and Systems, 2007

ABSTRACT Not Available

ABSTRACT The paper considers the linear feedback systems built around cut-inserted ideal transfor... more ABSTRACT The paper considers the linear feedback systems built around cut-inserted ideal transformers. It is shown that introducing the second additional transformer in cascade connection with the first one and doing the cut in the wire between the transformers one may reduce this method to the previously known Cut-Insertion Theorem (CIT) method. The cut-inserted ideal transformer method is reduced to the second form of the cut-inserted two-port including a voltage source on one side of the cut and a current source on the other side. Then, in the usual way, one obtains the parameters of the feedback system of order two (i.e. having two essential nodes). This system requires consideration of three loops; it may be further analyzed using Mason's rules.

IEEE Transactions on Circuits and Systems, 1987

Two models are compared which describe amplitude transients in an oscillator with an amplitude co... more Two models are compared which describe amplitude transients in an oscillator with an amplitude control system. The approximate model is a linearization of the more complicated exponential model. Using an amplitude control system that employs squaring circuits to derive the control signal, the two equations are solved in closed form and the transient responses are compared. It is found that

The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002., 2002

The transconductance characteristics of MOS transistors realized in 0.18 μm CMOS technology have ... more The transconductance characteristics of MOS transistors realized in 0.18 μm CMOS technology have a zero-temperature coefficient (ZTC) bias point. The presence of this point influences performance of both analog and digital circuits. The offset voltage drift in a source-coupled differential pair strongly increases, if the transistor drain currents are equal to the bias currents of ZTC point. It is also