Danie Auret | University of Pretoria (original) (raw)
Uploads
Papers by Danie Auret
Physica B: Condensed Matter, 2009
Journal of Physics: Conference Series, 2008
In this work we report firstly on the behaviour of Schottky barrier diodes (SBD's... more In this work we report firstly on the behaviour of Schottky barrier diodes (SBD's) when subjected to thermal treatment after metallization. To better understand this, a systematic study of the interaction between thin gold films and crystalline germanium substrates was undertaken. Gold metal films having thicknesses of 30 and 100 nm have been prepared by means of thermal evaporation on
Applied Physics A Solids and Surfaces, 1993
Physica B: Condensed …, 2009
Deep-level transient spectroscopy (DLTS) measurements were used to characterize the electrical pr... more Deep-level transient spectroscopy (DLTS) measurements were used to characterize the electrical properties of MOCVD grown, europium-(Eu) and xenon-(Xe) implanted GaN films on sapphire substrates. Implantation energy was 80keV with a fluence of 1× 1014cm− 2 ...
Physical Review B, 1995
... VOLUME 51, NUMBER 24 Electronic and transformation properties of a metastable defect introduc... more ... VOLUME 51, NUMBER 24 Electronic and transformation properties of a metastable defect introduced in n-type GaAs by a-particle irradiation F. Danie Auret, Rudolph M. Erasmus, Stewart A. Goodman, and Walter E ... 6M. Levinson, M. Stavola, JL Benton, and LC Kimerling, Phys. ...
Physica B: Condensed Matter, 2009
Journal of Physics: Conference Series, 2008
In this work we report firstly on the behaviour of Schottky barrier diodes (SBD's... more In this work we report firstly on the behaviour of Schottky barrier diodes (SBD's) when subjected to thermal treatment after metallization. To better understand this, a systematic study of the interaction between thin gold films and crystalline germanium substrates was undertaken. Gold metal films having thicknesses of 30 and 100 nm have been prepared by means of thermal evaporation on
Applied Physics A Solids and Surfaces, 1993
Physica B: Condensed …, 2009
Deep-level transient spectroscopy (DLTS) measurements were used to characterize the electrical pr... more Deep-level transient spectroscopy (DLTS) measurements were used to characterize the electrical properties of MOCVD grown, europium-(Eu) and xenon-(Xe) implanted GaN films on sapphire substrates. Implantation energy was 80keV with a fluence of 1× 1014cm− 2 ...
Physical Review B, 1995
... VOLUME 51, NUMBER 24 Electronic and transformation properties of a metastable defect introduc... more ... VOLUME 51, NUMBER 24 Electronic and transformation properties of a metastable defect introduced in n-type GaAs by a-particle irradiation F. Danie Auret, Rudolph M. Erasmus, Stewart A. Goodman, and Walter E ... 6M. Levinson, M. Stavola, JL Benton, and LC Kimerling, Phys. ...