A testability-dependent maintainability-prediction technique (original) (raw)

Abstract

k CONCLUSIONS Existing maintainability prediction techniques for electronic systems do not directly take into account some important measures of testability. This paper outlines a new meantime to repair (MTTR) prediction technique vhich i s a modification of MIL-HDBK-472 procedure V.

Key takeaways

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  1. This paper presents a modified MTTR prediction technique incorporating testability measures.
  2. The technique evaluates six distinct maintenance philosophies affecting fault correction times.
  3. MTTR is influenced by TDET, which is the average fault detection time.
  4. Each maintenance philosophy dictates methods for fault isolation and unit replacement.
  5. Automated software, the Testability Interfaced Maintainability Estimator, is available for DoD use.

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