Atomic Force Microscopy AFM (original) (raw)
Atomic force microscopy is a convenient and exceptionally rich source of information about materials on the nano-scale. The instrument can be configured to operate in a large number of modes. The main task of AFM is to produce reliable and repeatable measurement of surface and intermolecular forces, which are needed for surface analysis and provide plentiful of information regarding other features of specimen. These diverse modes measure different atomic forces that are acting between apex and specimen surface and are used for producing topographical image of the sample with high molecular resolution. The force measurement is by way of cantilever deflection measures. The cantilever can be made by piezoelectric material, whereas it is a piezoelectric stage that moves the specimen with respect to the tip. The cantilever is affected by position, tip-sample separation, it’s material, and different forces. A beam of laser focused on the force sensing/imposing lever and reflected onto a sensitive detector which is position sensing photo diode PSPD. Due to high resolution and small contact areas there is no need of vacuum and problems due to contamination and roughness are minimized.
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