Introduction of misfit dislocations into strained-layer GaAs/InxGa1–xAs/GaAs heterostructures by mechanical bending (original) (raw)
Related papers
Journal of Applied Physics, 2003
Strain-relief mechanisms and nature of misfit dislocations in GaAs/Si heterostructures
Materials Science and Engineering: A, 1989
Kinetics of dislocation-mediated strain relaxation in InGaAs/GaAs heteroepitaxy
Journal of Crystal Growth, 2003
Strain relaxation by 〈100〉 misfit dislocations in dilute nitride InxGa1-xAs1-yNy/GaAs quantum wells
physica status solidi (a), 2005
Optical and Quantum Electronics
Dislocations in medium to highly mismatched III–V epitaxial heterostructures
Journal of Crystal Growth, 1993
Strain Relaxation in Compositionally Graded InGaAs/GaAs Heterostructures
Misfit dislocations in GaAsN/GaAs interface
Journal of Materials Science-Materials in Electronics, 2003
Applied Physics Letters, 2002
Journal of Applied Physics, 1988
Revealing of threading and misfit dislocations in partially relaxed InGaAs/GaAs heterostructures
physica status solidi (c), 2004
Misfit-Dislocation Induced Surface Morphology of InGaAs/GaAs Heterostructures
Microchimica Acta, 2004
Applied Surface Science, 1998
Acta Metallurgica, 1989
The effect of dislocation core structure on the plastic and fracture behavior of GaAs and InP
Physica Status Solidi (c), 2005
Mechanical properties of undoped GaAs. II: The brittle-to-ductile transition temperature
Acta Materialia, 2007
Growth temperature dependence of strain relaxation during InGaAs/GaAs(001) heteroepitaxy
Journal of Crystal Growth, 2011
Comparison of Experiments and Theories for Plastic Deformation in thermally processed GaAs Wafers
Crystal Research and Technology, 2000
Reorientation of Misfit Dislocations During Annealing in InGaAs/GaAs(001) Interfaces
MRS Proceedings, 1993
Philosophical Magazine A-physics of Condensed Matter Structure Defects and Mechanical Properties, 2001
Semiconductor Physics, Quantum Electronics and Optoelectronics
Mechanical properties of undoped GaAs. Part I: Yield stress measurements
Acta Materialia, 2007
Critical thickness for misfit dislocation formation in InAs/GaAs (110) heteroepitaxy
Journal of Colloid and Interface Science, 2005
Mechanical strain and defect distributions in GaAs-based diode lasers monitored during operation
Structural characterization techniques for the analysis of semiconductor strained heterostructures
Mikrochimica Acta, 1994
Thermal processing induced plastic deformation in GaAs wafers
Materials Science and Engineering: B, 2001