A Novel BiST and Calibration Technique for CMOS Down-Converters (original) (raw)

2008 4th IEEE International Conference on Circuits and Systems for Communications, 2008

Abstract

This paper presents a new digital calibration methodology that allows CMOS Gilbert cell down-converters to meet their block specifications under large process, temperature and power supply variations. The calibration method consists of a novel built-in self test for direct conversion receivers that is able to measure the gain, and the second and third order intermodulation products of the mixer. A

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