Simulation of X-ray topographs (original) (raw)

X-ray topography is a non-destructive method for making defects such as dislocations, planar defects and walls visible in crystalline materials. It is complementary to electron microscopy since it permits these defects to be characterized in macroscopic samples. In many cases the simulation of the images is the only means of fully understanding the contrast of the experimental topographs. Although developed as early as 1967, simulation remained a theoretical tool for a long time, since the computation of the images took much too long and was of poor quality. The rapid progress in computing facilities and better numerical algorithms now permits its use as an ordinary means for defect identification. The aim of this paper is to review the present state of development of the simulation of X-ray topographs.