THz-TDS based near-field imaging and spectroscopy at 25 nm length scale (original) (raw)

THz-TDS based near-field imaging and spectroscopy at 25 nm length scale

Conference on Lasers and Electro-Optics, 2015

Abstract

We demonstrate THz near-field imaging and spectroscopy at length scales as small as ca. 25 nm based on integration of a standard THz-TDS system into a commercial scattering-type Scanning Near-field Optical Microscopy (s-SNOM) system.

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