Abstract Space Radiation Environment and Radiation Hardness Assurance Tests of Electronic Components to Be Used in Space Missions (original) (raw)
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Considering the extensive usage of electronic systems in Spacecraft and harsh radiation environment in the Space, radiation effects on electronic systems and development of radiation hardening electronic systems have been a topic of research. Researchers are trying to solve this problem at various abstraction levels, starting from fabrication technology to packaging and at system level. This paper covers an exhaustive survey on Radiation Hardening by Design. This survey has covered the research work from nearly 80’s to current state of art.
In this article the effects of radiations on discrete and complex electronic devices were analyzed. In the preliminary phase of this work the space environment was studied, referring to radiations and their effects on the matter and on electronic devices. The main radiation-hardening techniques were investigated, in particular the "by-layout" techniques. One of these rad-hard devices is the edgeless transistor (ELT). A static electrical characterization, before the irradiation (fresh condition), was conducted on these devices in order to evaluate their features with respect to the standard ones (STD). The measures have highlighted the differences between the ELT types, confirming the main features of ELTs, as shown in literature as well. Another investigation regarded the irradiation test of some 8Mbit TOPAZ flash memories using Boron ions. These test were conducted both in the active state (during the reading of memory cells) and in the passive state (in standby). Thanks ...