Exploring semiconductor quantum dots and wires by high resolution electron microscopy (original) (raw)

Journal of Physics: Conference Series, 2010

Abstract

We review in this communication our contribution to the structural characterisation of semiconductor quantum dots and wires by high resolution electron microscopy, both in phase-contrast and Z-contrast modes. We show how these techniques contribute to predict the preferential sites of nucleation of these nanostructures, and also determine the compositional distribution in 1D and 0D nanostructures. The results presented here were produced in the framework of the European Network of Excellence entitled "Self-Assembled semiconductor Nanostructures for new Devices in photonics and Electronics (SANDiE)".

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