Combination of ToF-SIMS imaging and AFM to study the early stages of corrosion in Al-Cu thin films (original) (raw)

Journal of The Electrochemical Society, 2010

Abstract

The pitting corrosion of Al-Cu thin film alloys was investigated using samples that were heat treated in air to form through-thickness Al2Cu particles within an Al-0.5%Cu matrix. Time-of-Flight SIMS (ToF-SIMS) analysis revealed Cu-rich regions 250 - 800 nm in lateral extent near the metal/oxide interface. Following exposure that generated pitting corrosion, secondary electron, secondary ion, and AFM images showed pits

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