Multiwavelength (045–106 μm) angle-resolved scatterometer or how to extend the optical window (original) (raw)

Surface Characterization of optical elements based on monochromatic scattered light techniques

Stefan Bosse

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Scatterometer of visible light for 2D rough surfaces

Martha Rosete-aguilar

Review of Scientific Instruments, 2004

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A system for measuring surface roughness by total integrated scattering

Lina Mazule

Journal of Physics D: Applied Physics, 2011

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Surface Roughness Studies with DALLAS-Detector Array for Laser Light Angular Scattering

Clayton Teague

Journal of Research of the National Bureau of Standards, 1984

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Application of the technique of total integrated scattering of light for micro-roughness evaluation of polished surfaces

Aissa Manallah

Physics Procedia, 2011

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Surface roughness measurements by means of speckle wavelength decorrelation

Umberto Perini, S. Musazzi

Optics Communications, 1979

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Microstructure characterization by angle-resolved scatter and comparison to measurements made by other techniques

Lars Mattsson

Applied Optics, 1992

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Large-Angle In-Plane Light Scattering from Rough Surfaces

Gwo-Ching Wang

Applied Optics, 2000

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Laser optical roughness measurement

Numan Durakbasa

Measurement, 1988

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Optical diagnostics of slightly rough surfaces

Peter Maksimyak

Applied Optics, 1992

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Effects of Roughness on Scatterometry Signatures

Brent Bergner

Frontiers of Characterization and Metrology For Nanoelectronics: 2011, 2011

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Surface roughness characterization by acousto-optical methods. Sub-wavelength wavelength resolution with evanescent acoustical waves

Nicolas Perez

Proceedings of the Interntional Congress on Ultrasonics, 2007

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Surface roughness measurement by speckle contrast under the illumination of light with arbitrary spectral profile

Lioudmila Tchvialeva, David McLean

Optics and Lasers in Engineering, 2010

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Roughness measurement of oriented surface by depolarization of scattered light

Magda Mello

Optics and Lasers in Engineering, 2019

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Utilization of Optical Methods for Determination of Surface Properties

Miloslav Ohlídal

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Oblique incidence interferometry of rough surfaces using a novel Dove-prism spectrometer

Myles MacBean

Applied Optics, 1984

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Challenges in the areal measurement of surface roughness and shape at the micro and nanoscale

S. Roques

Journal of Physics: Conference Series, 2014

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A fibre-optic surface-roughness sensor

Ulf Persson

Journal of Materials Processing Technology, 1999

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Surface roughness measurement through a speckle method

Mario Garavaglia

1990

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Light-scattered measurements using Fourier optics: a new tool for surface characterization

Mathieu Luet

Optical Metrology in Production Engineering, 2004

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New Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials

Miroslav Hain

Measurement Science Review, 2012

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Submillimeter Wavelength Scattering From Random Rough Surfaces

erich grossman

IEEE Transactions on Terahertz Science and Technology, 2017

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Wide-field scanning white light interferometry of rough surfaces

Peter J de Groot

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Absolute measurement of surface roughness

Joris Dirckx

Applied Optics, 1990

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Treatment of light scattering by a rough surface in terms of its three-dimensional spectrum

Colin Sheppard

Proceedings of SPIE, 1993

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Angle resolved scattering as a tribological investigation tool for surface characterization

S. Bouhtiyya, M. Woydt, D. Spaltmann

Wear, 2015

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Optical Fourier transform scatterometry for LER and LWR metrology

Thierry LEROUX

2005

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Surface roughness determination using the acousto-optic technique: Theory and experiment

Martine Wevers, Oswald Leroy

Applied Physics Letters, 1997

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Non-Contact Measurement of Surface Roughness by Conoscopic Holography Systems

Sabino Mateos

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Spectral-density function of the surface roughness for polished optical surfaces

antoine llebaria

Journal of the Optical Society of America, 1983

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Toward the reflectance measurement of micro components

Philippe Voarino, herve piombini

Journal of the European Optical Society: Rapid Publications, 2010

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New feasibilities for characterizing rough surfaces by optical-correlation techniques

Steen Hanson, Peter Maksimyak

Applied Optics, 2001

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Optical Fourier transform scatterometry for LER and LWR metrology

P. Boher

Metrology, Inspection, and Process Control for Microlithography XIX, 2005

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AC 2007-1319: DESIGNING A PORTABLE SURFACE ROUGHNESS INSPECTION PROBE

Saeid Moslehpour

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