Heavy ion testing at the galactic cosmic ray energy peak (original) (raw)

This paper discusses the implications of heavy ion testing on microelectronic components for assessing single-event effects (SEE) in the context of galactic cosmic rays (GCR). It presents results from recent experiments conducted at the NASA Space Radiation Effects Laboratory using a 56Fe beam at varying energies, highlighting the relevance of linear energy transfer (LET) in understanding the interactions with devices such as SRAMs and FPGAs. The findings emphasize the necessity for improved test conditions to simulate the actual space environment characterized by heavy ion presence.