Large-distance refocusing of a submicrometre beam from an X-ray waveguide (original) (raw)
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Submicrometre Beams from a Hard X-ray Waveguide at a Third-Generation Synchrotron Radiation Source
Journal of Synchrotron Radiation, 1998
The use of an X-ray waveguide for scattering experiments at an undulator of a third-generation synchrotron radiation source is discussed. The performance with a perfect crystal monochromator, multilayer monochromator and focusing mirror is explored. A maximum flux of 8 x 109 photons s-1 at ~. = 0.083 nm was obtained for a 0.15 (V) × 600 (H) ~tm 2 beam at the exit of the waveguide with a multilayer monochromator. The combination of an Si (111) monochromator and ellipsoidal mirror resulted in a flux of-~ 10 9 photons s-1 but with a horizontal compression of the beam to-30 l~m. The use of the waveguide in diffraction experiments is addressed.
2011
Many modern synchrotron beamlines are able to focus X-rays to a few microns in size. Although the technology to achieve this is well established, performing routine experiments with such beams is still time consuming and requires careful set up. Furthermore there is a need to be able to carry out experiments using hard X-ray beams with even smaller beams of between 100nm and 10nm. There are focussing optics that are able to do this but integrating these optics into a stable and a usable experimental set up are challenging. Experiments can often take some hours and any change in position of the beam on the sample will adversely affect the quality of the results. Experiments will often require scanning of the beam across the sample and so mechanisms suitable for high resolution but stable scanning are required. Performing routine experiments with nanometre sized beams requires mechanical systems to be able to position the sample, focussing optics, detectors and diagnostics with significantly higher levels of stability and motion resolution than is required from so called micro focus beam lines. This dissertation critically reviews precision engineering and associated technologies that are relevant for building nano focus beamlines, and the following key issues are explored: Long term position stability due to thermal effects Short term position stability due to vibration Position motion with nanometre incremental motion Results of some tests are presented and recommendations given. Some test results are presented and guidance on designing nano focus beamlines presented.
Progress toward submicron hard x-ray imaging using elliptically bent mirrors
1997
Of the many methods used to focus x-rays, the se of mirrors with an elliptical curvature shows the most promise of providing a sub-micron white light focus. Our group has been developing he techniques of controlled bending of mirror substrates in order to produce the desired elliptical shape. We have been successful in producing surfaces with the required microradian slope error tolerances. Details of the bending techniques used, results from laboratory slope error measurements using a Long Trace Profiler and data from the measurement of focus shape using knife edge and imaging methods using x-rays in the 5 - 12 KeV energy range are presented. The development of a white light focusing opens many possibilities in diffraction and spectroscopic studies.
Hard X-ray nanofocusing at low-emittance synchrotron radiation sources
Journal of synchrotron radiation, 2014
X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the emittances of the storage ring and the lateral sizes of the electron beam. Optimal source parameters are calculated to obtain efficient and diffraction-limited nanofocusing. With decreasing emittance, the usable fraction of the beam for diffraction-limited nanofocusing experiments can be increased by more than two orders of magnitude compared with modern storage ring sources. For a diffraction-limited storage ring, nearly the whole beam can be focused, making these sources highly attractive for X-ray scanning microscopy.
Beam-shaping condenser lenses for full-field transmission X-ray microscopy
Journal of Synchrotron Radiation, 2008
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Multiple micro mirrors for X-ray focusing and collimation
Optics Communications, 2006
A novel route for fabrication of compact optical system for X-rays is presented. It is based on the extensive use of tools developed for microelectronics and micromechanics: electron beam lithography, optical lithography and X-ray lithography. Virtually any shape can be obtained in order to match the system to the different needs. In this paper, we concentrate the attention on focusing system made by nested mirrors. A system for synchrotron radiation source and one for laboratory source have been designed and simulated by a raytracing code developed ad hoc. The main parameters and the fabrication tolerance errors have been evaluated. The first prototypes have been produced following different fabrication routes. They are presented here together with considerations for future developments.
Nearly diffraction-limited line focusing of a hard-X-ray beam with an elliptically figured mirror
Journal of Synchrotron Radiation, 2002
An elliptical mirror for X-ray microfocusing was manufactured using the new fabrication methods of elastic emission machining and plasma chemical vaporization machining. Surface pro®les measured using stitching interferometry showed a maximum deviation around the ideal ®gure of 7 nm peak-to-valley. The mirror showed nearly diffraction-limited focusing performance, with a 200 nm line width at the focus. Wave-optical calculations, taking the measured surface pro®le into consideration, reproduced well the measured focusing properties both at and around the beam waist.