Synthesis and effect of post-deposition thermal annealing on morphological and optical properties of ZnO thin film (original) (raw)
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2020
This study carried out on the effect of precursor concentration and annealed substrate temperature on the crystal structure, electronic and optical properties of ZnO thin film. An aqueous solution of Acid Nitrite was used as precursors and its concentration was varied from 0.1 M to 0.4 M. The ZnO thin film was deposited on the glass substrate by Spray Pyrolysis Deposition and annealed with different temperature from 300 o C to 600 o C. The crystal structure, electronic and optical properties were investigated by Scanning Electron Microscopy (SEM), X-ray diffraction (XRD) and UV-Spectrometer. XRD result showed that all thin films have amorphous hexagonal wurtzite crystalline. Particle sizes ranging from 21.83 to 43.67 nm were calculated through Debye-Scherer Method. It showed that the concentration of the precursor had slightly impact on the particle size. Meanwhile, the increase in particle size with increasing annealed temperature is found to be gradual. The average transparent of ...
Materials Science-Poland, 2019
An aqueous colloidal solution was prepared at 80 °C and pH = 9 from suitable chemical compounds to produce zinc oxide (ZnO) crystals and thin films. The ZnO crystals were grown in the colloidal solution under special conditions. Their micrographs showed ZnO rods with hexagonal structure. The number of the rods, increased over time. The ZnO thin films were produced on glass substrates in the same colloidal solution using the chemical bath deposition (CBD) method in different deposition times. The produced films were post-annealed for about one hour at 400 °C. Crystalline structure, phase transitions and nanostructure of the films were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). ZnO wurtzite structure was dominant, and by increasing the deposition time, the films became more crystalline. Nanostructure of the films changed from rod to wire and transformed into pyramid-like structures. Also, morphology of the films chang...
Optical and structural properties of thin films of ZnO at elevated temperature
Zinc oxide (ZnO) thin films were prepared on glass substrate by sol-gel dip-coating method. The paper presents the properties of zinc oxide thin films deposited on soda-lime-glass substrate via dip-coating technique, using zinc acetate dehydrate and ethanol as raw materials. The effect of withdrawal speed on the crystalline structure, surface morphology and optical properties of the thin films has been investigated using XRD, SEM and UV-Vis spectrophotometer. X-ray diffraction study shows that all the films have hexagonal wurtzite structure with preferred orientation in (0 0 2) direction and transmission spectra showed highly transparent films with band gap ranging from 3.78 to 3.48 eV.
2022
In this work, the effects of different post-annealing temperatures on the prepared ZnO glass films were studied. The deposited ZnO films were prepared by a sol–gel spin coating technique. The influence of the annealing temperature on the photoluminescent, elemental, optical, structural, crystallite size properties were investigated. The PL spectra show a blue shift in DLE and the intensities of the DLE emission decreased due to the annealing temperature increasing. EDS peaks confirm the successful synthesis of ZnO film. The optical transparency of ZnO films was measured at different annealing temperatures and showed a visible transmittance of 94%. The optical band gap of ZnO film was increased as the annealing temperature increased. The XRD results show the deposited ZnO film has a hexagonal wurtzite structure. Diffraction intensity and crystal size increase with the increase in annealing temperature, while full width at half maxima decreases.
Zinc oxide thin films were prepared by sol gel method and spin coating technique, using zinc acetate as precursor solution on glass substrate. The prepared films were annealed at three different temperatures to study the effect of annealing on the structural and optical properties of ZnO thin films. The deposited and annealed films were characterized by X-ray diffraction (XRD), UV-Vis-NIR spectroscopy and scanning electron microscopy (SEM) coupled with microanalysis (EDX). The XRD pattern shows that ZnO films are polycrystalline in nature and crystallite size increases with the increase in annealing temperature. Optical transmittance measurements were taken using UV-Vis-NIR spectrophotometer and the calculated values of the direct band gap energy, Eg was between 3, 28 and 3, 42 eV.
Uniform & homogeneous Zinc Oxide thin films (ZnO) were deposited on cleaned glass substrates by spray CVD technique. Zinc acetate dehydrate and methanol were used as a starting material and solvent. The effect of deposition parameters on structural, optical & electrical properties of the ZnO thin films was investigated. Thermogravimetric analysis (TGA) of the Zinc acetate showed that weight loss continued until 330 o C. Structural characterization confirmed polycrystalline nature possessing hexagonal wurtzite structure with crystallite size varying between 100.7 and 268.6 nm. The electrical studies established that the films deposited at 330 o C reveal enhancing electrical conduction in ZnO thin films and beyond that the distortion caused in the lattice causes to lower the conductivity. The optical absorption studies reveal that the transition is direct band gap energy. The films also exhibited distinct changes in their optical properties, including a red shift of bandgap. KEYWORDS:...
A research on the Deposition and Characterization of ZnO Thin Films by Chemical Bath Deposition Technique using Ammonia (NH 3 ) as a complexing agent. Thin films of ZnO are deposited onto glass substrates at room temperature for 5hours. The optical properties of the films were measured using Double Beam UV-Spectrophotometer with serial number UV061514, Rutherford Back Scattering Spectroscopy (RBS) analysis revealed that the thin filmshave percentage ratios of the elements of Zn/O, 47/53 as annealed for 3hours at the temperature of 250⁰C and Zn/O, 48.8/51.2as annealed for 1hour at the temperature of 150⁰C. The thicknesses are 80nm for 3hours and 150nm for 1hour asannealed samples at 250⁰C and 150⁰C respectively. It was found that ZnO thin films exhibits n-type conduction. Optical band gap values of the twosamples are 3.1±0.05eV as annealed for 3hours and 3.3±0.05eV as annealed for 1hour with an average of 3.2±0.05eV. Other optical properties calculated from transmittance using appropriate equations are absorbance, reflectance, band gap , absorption coefficient, optical conductivity, refractive index and extinction coefficient.
Nuclear Instruments and …, 2008
Highly oriented and transparent ZnO thin films have been fabricated on ultrasonically cleaned quartz substrates by the sol-gel technique. X-ray diffraction, UV-VIS, FTIR, photoluminescence and SEM are used to characterize ZnO thin films. X-ray diffraction study show that all the films prepared in this work have hexagonal wurtzite structure, with lattice constants a = b = 3.260 Å, c = 5.214 Å. The optical band gap energy of the thin films is found to be direct allowed transition ~3.24 eV. The FTIR spectrum of the film has the characteristics ZnO absorption band at 482 cm −1. The photoluminescence spectrum of the samples has an UV emission peak centred at 383 nm with broad band visible emission centred in the range of 500-600 nm.
The Effect of Annealing, Doping on the Properties and Functionality of Zinc Oxide Thin Film; Review
Sol-Gel Method - Design and Synthesis of New Materials with Interesting Physical, Chemical and Biological Properties [Working Title]
The review of the effect of annealing and doping zinc oxide thin films on both the structural and optical properties has been carried out for different growth techniques such as sol-gel growth technique. The structural and optical properties were carried out using thin films were characterized SEM, XRD while TE and TM guided mode spectra, UV-VIS-NIR (HR4000Ocean Optics) and UV-Visible spectrometry were used accordingly respectively. From the results, it was clearly observed the both the morphological and the crystal characteristics structural characteristic, although increase in the percent of doping element affected it as the diffraction peak was shifts slightly to a lower angle side with report that crystal structure of the film deteriorate at a higher doping concentration of doping element as it decreases the c-lattice. There was also adjustment on the band gap of the material when it was annealed at various temperatures and also when the doping concentration was varied. The film exhibited lower absorbance, high transmittance depend on the regions of electromagnetic wave spectra.
Structural and optical characterization of ZnO and AZO thin films: the influence of post-annealing
Journal of Materials Science: Materials in Electronics, 2015
ZnO thin films were deposited on glass substrate using a sol-gel method. The structural and optical properties at different annealing temperatures were studied using X-ray diffraction (XRD), ultra-violet-visible spectroscopy and Raman spectroscopy. X-ray diffraction results show that the c-axis orientation became stronger as the annealing temperature increased from 300 to 500 º C. the optical band gap energy was calculated from the optical absorption using UV-Vis spectrophotometer. The optical band gap of ZnO thin films decreases from 3.378 eV to 3.338 eV as the annealing temperature increases from 300 to 500 ºC, the experimental data are in agreement with the calculated results by specific models of refractive index.