SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE (original) (raw)

Vibration isolation for scanning tunneling microscopy

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1987

Vibration isolation technology for scanning tunneling microscopy (STM) to suppress the external mechanical perturbation down to a subatomic scale is described. The system is simplified into two subsystems, a tunneling assembly and a supporting table. Each of them has its own mechanical eigenfrequency. The principle of the isolation exists in making the two eigenfrequencies very different from each other. A theory of isolation developed is based on a model of multiply coupled oscillators with damping. Experimental results of the isolation characteristics for the two types of isolators constructed, one consisting of two-stage coil springs and the other of multiply stacked metal plates with rubber pieces among them, are well explained by the theory. STM images of graphite are obtained by using these isolators combined with various tunneling assemblies. Thereby the basis for design of the isolators is clarified.

Vibration isolation analysis for a scanning tunneling microscope

Review of Scientific Instruments, 1992

We analyze the efficiency of a vibration isolation system (VIS) for a scanning tunneling microscope as a function of the different parameters involved. The VIS consists of a stack of several metallic plates, separated by rubber elements with known properties. We show three-dimensional graphs obtained for different values of parameters such as rigidity (spring) constant (K), damping constant (C), mass (M), and the number of stages (n). Analyzing the K dependence of the position of the main peaks, we find a parabolic behavior when the damping constant is small, with a slight deviation for larger values.

A simple, ultrahigh vacuum compatible scanning tunneling microscope for use at variable temperatures

Review of Scientific Instruments, 1996

We present the construction of a very compact scanning tunneling microscope ͑STM͒ which can be operated at temperatures between 4 and 350 K. The tip and a tiny tip holder are the only movable parts, whereas the sample and the piezoscanner are rigidly attached to the body of the STM. This leads to an excellent mechanical stability. The coarse approach system relies on the slip-stick principle and is operated by the same piezotube which is used for scanning. As an example of the performance of the device, images of a NbSe 2 surface with atomic resolution are obtained.

Active Vibration Isolation for a Long Range Scanning Tunneling Microscope

Asian Journal of Control, 2008

Vibration isolation or control is critical for the optimum operation of the Molecular Measuring Machine (M 3), a high-resolution, length-metrology instrument at the National Institute of Standards and Technology. This paper describes the extension of the M3 Mallock isolation suspension from passive to six degrees-of-freedom (DOF) active vibration isolation. System modeling is presented, and experimental system identification is carried out for the purpose of model verification. The paper then compares the vibration isolation performance achieved using a classical proportional-integral-derivative (PID) controller versus that achieved using a modified, model-based, Linear-Quadratic-Gaussian (LQG) controller. Attenuation of 3 dB to 15 dB is achieved within the active vibration isolation control bandwidth, and images taken with the M 3 scanning tunneling microscope (STM) probe show improved performance.

A scanning tunneling microscope with a wide sampling range

Review of Scientific Instruments, 1990

C{)n~truction of a simple scanning tunneling microscope (STM) is described. This STM is suitable for atmospheric, controiled atmosphere, and high vacuum (but not UHV) work. This STM is especially wen suited for determining surface topography on the 0.1 nm scale when images must be obtained over a wide sampling region (mm). Interchangeable piezo heads allow the STM to be used either for atomic resolution or for large (800 X 800 urn) area scans. Atomic resolution pictures of the graphite surface demonstrate that this design is suitable for use with structures smaller than 0.1 nm. An image of a thin film of Au, deposited on pyrex, is also presented.

Compact design of a transmission electron microscope-scanning tunneling microscope holder with three-dimensional coarse motion

Review of Scientific Instruments, 2003

A scanning tunneling microscope ͑STM͒ with a compact, three-dimensional, inertial slider design is presented. Inertial sliding of the STM tip, in three dimensions, enables coarse motion and scanning using only one piezoelectric tube. Using the same electronics both for scanning and inertial sliding, step lengths of less than 5% of the piezo range were achieved. The compact design, less than 1 cm 3 in volume, ensures a low mechanical noise level and enables us to fit the STM into the sample holder of a transmission electron microscope ͑TEM͒, while maintaining atomic scale resolution in both STM and TEM imaging.

A combined apparatus of scanning reflection electron microscope and scanning tunneling microscope

Review of Scientific Instruments, 1997

A scanning reflection electron microscope (SREM) combined with a scanning tunneling microscope (STM) has been developed for the purpose of nanoscale structure fabrication under ultrahigh vacuum conditions. A STM unit consists of a piezoelectric tube scanner and an inch runner for coarse and fine approach of a STM tip. A sample holder and the STM unit have six drive axes relative to an electron gun for simultaneous observation by SREM and STM. Energy-dispersive x-ray spectroscopy equipment is also installed for surface sensitive elemental analysis. It has been demonstrated that on a Si(111)7×7 surface atomic steps and 7×7 unit, cells can be observed in the SREM and STM images, respectively, and that surface elements with less than 1 ML thickness are detectable.

Design and operation of a low-temperature scanning tunneling microscope suitable for operation below 1 K

Ultramicroscopy, 1992

A scanning tunneling microscope suitable for very low temperatures has been designed, and preliminary testing has been carried out. In order to improve cooling and temperature uniformity the instrument is arranged for operation immersed in the 3He-4He mixture inside the mixing chamber of a small dilution refrigerator. A discussion of the specific problems present in the design of this kind of an instrument is given as well as a description of our design. Special attention is given to the vacuum sealing and vibration-damping solutions required.

Design and performance of a beetle-type double-tip scanning tunneling microscope

Review of Scientific Instruments, 2006

A combination of a double-tip scanning tunneling microscope with a scanning electron microscope in ultrahigh vacuum environment is presented. The compact beetle-type design made it possible to integrate two independently driven scanning tunneling microscopes in a small space. Moreover, an additional level for coarse movement allows the decoupling of the translation and approach of the tunneling tip. The position of the two tips can be controlled from the millimeter scale down to 50 nm with the help of an add-on electron microscope. The instrument is capable of atomic resolution imaging with each tip.