Automatic Functional Stress Pattern Generation for SoC Reliability Characterization (original) (raw)

2009 14th IEEE European Test Symposium, 2009

Abstract

Reliability testing is increasingly used not only to reduce Infant Mortality effects, but also for Reliability Characterization. This paper first discusses the characteristics of the stimuli to be used during Reliability Characterization experiments, and outlines the importance of adopting a functional approach. Secondly, the paper describes a novel approach to automatically generate suitable stress patterns to be used during the

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