An Analysis of Electron Direct Tunneling Current through a High-K MOS Capacitor by Including the Effect of a Trap between HfO[sub 2] and SiO[sub 2] Interfaces (original) (raw)
Structural and transport characterization of ultra thin Ba0.05Sr0.95TiO3 layers grown over Nb electrodes for the development of Josephson junctions Appl. Phys. Lett. 100, 012602 (2012) Resonant tunneling in Si/SiGe/Si structures with a single quantum well under surface passivation J. Appl. Phys. 110, 123710 (2011) Rotational tunneling in CH4 II: Disorder effects J. Chem. Phys. 135, 224509 (2011) Transport and noise spectroscopy of MWCNT/HDPE composites with different nanotube concentrations J. Appl. Phys. 110, 113716 (2011)