Surface recristallization of CdS layers by pulsed - laser annealing (original) (raw)

2008 26th International Conference on Microelectronics, 2008

Abstract

Properties of spry pyrolysed CdS layers were changed purposefully using annealing by a pulsed-laser in oxygen ambient. The structural, phase and electrical characteristics before and after annealing have been compared. The layer surface has been studied by SEM, XRD and XPS analyses. The electrical and optic parameters have been measured as well. Layers with different structure and electro-optical characteristics have

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