APPLICATIONS OF TRANSMISSION X-RAY OPTICS (original) (raw)

Optics for coherent X-ray applications

Journal of synchrotron radiation, 2014

Developments of X-ray optics for full utilization of diffraction-limited storage rings (DLSRs) are presented. The expected performance of DLSRs is introduced using the design parameters of SPring-8 II. To develop optical elements applicable to manipulation of coherent X-rays, advanced technologies on precise processing and metrology were invented. With propagation-based coherent X-rays at the 1 km beamline of SPring-8, a beryllium window fabricated with the physical-vapour-deposition method was found to have ideal speckle-free properties. The elastic emission machining method was utilized for developing reflective mirrors without distortion of the wavefronts. The method was further applied to production of diffraction-limited focusing mirrors generating the smallest spot size in the sub-10 nm regime. To enable production of ultra-intense nanobeams at DLSRs, a low-vibration cooling system for a high-heat-load monochromator and advanced diagnostic systems to characterize X-ray beam pr...

Diffractive soft and hard X-ray optics

Journal de Physique IV (Proceedings), 2003

The Laboratory for Micro-and Nanotechnology provides the essential technologies necessary for the design and fabrication of diffractive x-ray optics for a wide range of applications. Over the past years, a] large variety of optics has been fabricated and testcd in collaboration with a large number of partners. To ensure good performance of the devices, they hâve to bc tailored to the spécifie needs of a spécifie x-ray optical experiment in terms of photon energy and spatial coherence of the source, as well as required spatial resolution, working distance and diffraction efficiency. We report on a sélection of such developments including transmission Fresnel phase zone plates for microscopy or microprobe applications at photon énergies ranging from the EUV to the multi-keV region. For photon énergies beyond 10 keV transmission zone plates are very rarcly used. Our récent devclopment of linear optics with ultra high aspect ratio structures has opened up a way to extend the applications of diffractive optics at least to thé 30 keV range. Besides focusing elements, other diffractive optics such as decoherers or beam splitters for interferometric applications are presentcd. refractive index =7-5-tj8 tabutated for most elements by Henke et at. [6]. For diffractive structures with a square wave profile, the first order diffraction efficiency E, at a given x-ray wavelength A is given by :

A compact synchrotron-based transmission X-ray microscope

Journal of Synchrotron Radiation, 2014

A compact transmission X-ray microscope has been designed and implemented based on a cylindrical symmetry around the optical axis that sharply limits the instabilities due to thermal mechanical drift. Identical compact multi-axis closed-loop actuation modules drive different optical components. The design is modular and simplifies the change of individual parts, e.g. the use of different magnification and focusing devices. This compact instrument can be easily transported between laboratory and synchrotron facilities and quickly put into operation. An automated alignment mechanism simplifies the assembly of different modules after transportation. After describing the design details, the results of the first tests are presented.

Characterization of X-ray optic performance

This paper reports the characterization of a high-efficiency polycapillary lens designed for microanalysis from a point source. The lens is unique in that it has been optimized for use over a broad energy range from 8 keV (Cu &) to 17.5 keV (MO I&). A n x-ray optical bench, which provides both high resolution imaging and energy resolving capabilities, was used to test the lens. Images of the focusing characteristics and transmission quality of the lens were obtained using a magnifying x-ray camera, and the focal-spot size and overall convergence were determined from these images. The focal spot size was also measured using a knife-edge technique, and the results compared with those obtained using the CCD camera. Measurements of the x-ray intensity with and without the lens were used to determine the x-ray flux gain at various energies.

AHEAD joint research activity on x-ray optics

2018

The progress of X-ray Optics joint research activity of the European Union Horizon 2020 AHEAD project is presented here covering the X-ray optic technologies that are currently being worked on in Europe. These are the Kirkpatrick Baez, lobster eye micropore (SVOM, SMILE), slumped glass, and silicon pore (ATHENA, ARCUS) optics technologies. In this activity detailed comparisons of the measurements, of the different optics produced by the participating optics groups, obtained mainly at the MPEs PANTER X-ray test facility, are compared with simulations. In preparation for the ATHENA mission a study has been made to design the BEaTRiX X-ray test facility for testing individual silicon pore optics mirror modules, and the realization of the facility is now on going. A zone plate collimating optics developed for PANTER is being studied, optimized, and tested at PANTER. This zone plate will be used for characterising a high quality optics module in a parallel beam to verify the BEaTriX perf...

Graded X-ray Optics for Synchrotron Radiation Applications

Journal of Synchrotron Radiation, 1998

Using X-ray diffractometry and spectral measurements, the structure and properties of graded X-ray optical elements have been examined. Experimental and theoretical data on X-ray supermirrors, which were prepared by the magnetron sputtering technique using precise thickness control, are reported. Measurements on graded aperiodic Si1−x Ge x single crystals, which were grown by the Czochralski technique, are also presented. The lattice parameter of such a crystal changes almost linearly with increasing Ge concentration. The measurements indicate that Si1−x Ge x crystals with concentrations up to 7 at.% Ge can be grown with a quality comparable to that of pure Si crystals.